Low energy electron microscopy and photoemission electron microscopy investigation of graphene

Low energy electron microscopy (LEEM) and photoemission electron microscopy (PEEM) are two powerful techniques for the investigation of surfaces, thin films and surface supported nanostructures. In this review, we examine the contributions of these microscopy techniques to our understanding of graph...

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Bibliographic Details
Published in:Journal of physics. Condensed matter 2012-08, Vol.24 (31), p.314209-20
Main Authors: Man, K L, Altman, M S
Format: Article
Language:English
Subjects:
Condensed matter
Condensed matter: structure, mechanical and thermal properties
Electron microscopy
Exact sciences and technology
Graphene
Imaging
Low energy
Microscopy
Photoemission
Physics
Silicon carbide
Structure and morphology
thickness
Surfaces and interfaces
thin films and whiskers (structure and nonelectronic properties)
Thin film structure and morphology
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Summary:Low energy electron microscopy (LEEM) and photoemission electron microscopy (PEEM) are two powerful techniques for the investigation of surfaces, thin films and surface supported nanostructures. In this review, we examine the contributions of these microscopy techniques to our understanding of graphene in recent years. These contributions have been made in studies of graphene on various metal and SiC surfaces and free-standing graphene. We discuss how the real-time imaging capability of LEEM facilitates a deeper understanding of the mechanisms of dynamic processes, such as growth and intercalation. Numerous examples also demonstrate how imaging and the various available complementary measurement capabilities, such as selected area or micro low energy electron diffraction (μLEED) and micro angle resolved photoelectron spectroscopy (μARPES), allow the investigation of local properties in spatially inhomogeneous graphene samples.
ISSN:0953-8984
1361-648X
DOI:10.1088/0953-8984/24/31/314209