High speed friction microscopy and nanoscale friction coefficient mapping

• Published in: Measurement science & technology 2014-11, Vol.25 (11), p.115401-9
• Main Authors: Bosse, James L, Lee, Sungjun, Andersen, Andreas Sø, Sutherland, Duncan S, Huey, Bryan D
• Format: Article
• Language: English
• Subjects: AFM; Atomic force microscopy; Data storage; Devices; Friction; High speed; Mapping; Nanostructure; Pits; Sliding; tribology
• ISSN: 0957-0233; 1361-6501
• DOI: 10.1088/0957-0233/25/11/115401

As mechanical devices in the nano/micro length scale are increasingly employed, it is crucial to understand nanoscale friction and wear especially at technically relevant sliding velocities. Accordingly, a novel technique has been developed for friction coefficient mapping (FCM), leveraging recent advances in high speed AFM. The technique efficiently acquires friction versus force curves based on a sequence of images at a single location, each with incrementally lower loads. As a result, true maps of the coefficient of friction can be uniquely calculated for heterogeneous surfaces. These parameters are determined at a scan velocity as fast as 2 mm s−1 for microfabricated SiO2 mesas and Au coated pits, yielding results that are identical to traditional speed measurements despite being ~1000 times faster. To demonstrate the upper limit of sliding velocity for the custom setup, the friction properties of mica are reported from 200 µm s−1 up to 2 cm s−1. While FCM is applicable to any AFM and scanning speed, quantitative nanotribology investigations of heterogeneous sliding or rolling components are therefore uniquely possible, even at realistic velocities for devices such as MEMS, biological implants, or data storage systems.