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Confocal luminescence study of nitrogen-vacancy distribution within nitrogen-rich single crystal CVD diamond

Confocal photoluminescence (PL) microscopy was used to study a distribution of negatively charged nitrogen-vacancy (NV−) defects within a surface and in a cross section of a homoepitaxial chemical vapor deposition (CVD) diamond layer intentionally grown with a nitrogen concentration close to the sol...

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Bibliographic Details
Published in:Laser physics 2016-01, Vol.26 (1), p.15202
Main Authors: Shershulin, V A, Samoylenko, S R, Kudryavtsev, O S, Bolshakov, A P, Ashkinazi, E E, Yurov, V Yu, Ralchenko, V G, Konov, V I, Vlasov, I I
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Language:English
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Summary:Confocal photoluminescence (PL) microscopy was used to study a distribution of negatively charged nitrogen-vacancy (NV−) defects within a surface and in a cross section of a homoepitaxial chemical vapor deposition (CVD) diamond layer intentionally grown with a nitrogen concentration close to the solubility limit. A variation in the PL intensity within the whole sample was found to exceed no more than 30% of the intensity maximum. The diamond layers with densely packed NV− arrays are a promising material platform for the design of highly sensitive magnetic field and temperature sensors, as well as for using this material in quantum optics and informatics technologies based on NV− spins.
ISSN:1054-660X
1555-6611
DOI:10.1088/1054-660X/26/1/015202