Enhancement of local piezoelectric properties of a perforated ferroelectric thin film visualized via piezoresponse force microscopy

• Published in: Journal of physics. D, Applied physics Applied physics, 2017-10, Vol.50 (42), p.425303
• Main Authors: Ivanov, M S, Sherstyuk, N E, Mishina, E D, Khomchenko, V A, Tselev, A, Mukhortov, V M, Paixão, J A, Kholkin, A L
• Format: Article
• Language: English
• Subjects: epitaxial ferroelectric film; ferroelectricity enhancement; focused ion beam milling; periodic photonic crystal; piezoresponse force microscopy
• ISSN: 0022-3727; 1361-6463
• DOI: 10.1088/1361-6463/aa8604

The local piezoresponse in a Ba0.8Sr0.2TiO3 epitaxial ferroelectric film perforated by cylindrical channels has been investigated experimentally by means of piezoresponse force microscopy (PFM). A large enhancement of the effective values for both lateral and vertical components of piezoelectric tensor was experimentally detected in the perforated film as compared to non-perforated structure-by a factor of 8 for the lateral and by a factor 2 for the vertical piezoresponse. This result is consistent with the previously reported enhancement of the optical second harmonic generation over perforated films observed in macroscopic experiments. We assume that a possible mechanism for the increased PFM response is due to reduction of stress and clamping in the film imposed by the substrate. The obtained insight is critical for understanding nanoscale piezo- and ferroelectric responses in photonic crystals fabricated by focused ion beam milling.