Effects of proton irradiation at different incident angles on InAlAs/InGaAs InP-based HEMTs Project supported by the National Natural Science Foundation of China (Grant Nos. 11775191, 61404115, 61434006, and 11475256), the Program for Innovative Research Team (in Science and Technology) in University of Henan Province, China (Grant No. 18IRTSTHN016), and the Development Fund for Outstanding Young Teachers in Zhengzhou University of China (Grant No. 1521317004)

InP-based high electron mobility transistors (HEMTs) will be affected by protons from different directions in space radiation applications. The proton irradiation effects on InAlAs/InGaAs hetero-junction structures of InP-based HEMTs are studied at incident angles ranging from 0 to 89.9° by SRIM sof...

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Bibliographic Details
Published in:Chinese physics B 2018-02, Vol.27 (2)
Main Authors: Sun, Shu-Xiang, Wei, Zhi-Chao, Xia, Peng-Hui, Wang, Wen-Bin, Duan, Zhi-Yong, Li, Yu-Xiao, Zhong, Ying-Hui, Ding, Peng, Jin, Zhi
Format: Article
Language:English
Subjects:
InAlAs/InGaAs hetero-junction
incident angle
InP-based HEMTs
proton irradiation
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Summary:InP-based high electron mobility transistors (HEMTs) will be affected by protons from different directions in space radiation applications. The proton irradiation effects on InAlAs/InGaAs hetero-junction structures of InP-based HEMTs are studied at incident angles ranging from 0 to 89.9° by SRIM software. With the increase of proton incident angle, the change trend of induced vacancy defects in the InAlAs/InGaAs hetero-junction region is consistent with the vacancy energy loss trend of incident protons. Namely, they both have shown an initial increase, followed by a decrease after incident angle has reached 30°. Besides, the average range and ultimate stopping positions of incident protons shift gradually from buffer layer to hetero-junction region, and then go up to gate metal. Finally, the electrical characteristics of InP-based HEMTs are investigated after proton irradiation at different incident angles by Sentaurus-TCAD. The induced vacancy defects are considered self-consistently through solving Poisson's and current continuity equations. Consequently, the extrinsic transconductance, pinch-off voltage and channel current demonstrate the most serious degradation at the incident angle of 30°, which can be accounted for the most severe carrier sheet density reduction under this condition.
ISSN:1674-1056
DOI:10.1088/1674-1056/27/2/028502