Structural, optical and electrical properties of SnxSy thin films grown by spray ultrasonic

Tin sulfide（Snx Sy/ thin films were prepared by a spray ultrasonic technique on glass substrate at 300℃.The influence of deposition time tD2, 4, 6, 8 and 10 min on different properties of thin films, such as（XRD）,photoluminescence（PL） and（UV） spectroscopy visible spectrum and four-point were investi...

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Bibliographic Details
Published in:Journal of semiconductors 2016-03, Vol.37 (3), p.14-19
Main Authors: Kherchachi, I. B., Attaf, A., Saidi, H., Bouhdjer, A., Bendjedidi, H., Benkhetta, Y., Azizi, R.
Format: Article
Language:English
Subjects:
optical and electrical properties
structural
tin sulfide
ultrasonic spray
X射线衍射分析
光致发光光谱
可见光谱
喷雾
电学性能
结构
薄膜性能
超声波技术
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Summary:Tin sulfide（Snx Sy/ thin films were prepared by a spray ultrasonic technique on glass substrate at 300℃.The influence of deposition time tD2, 4, 6, 8 and 10 min on different properties of thin films, such as（XRD）,photoluminescence（PL） and（UV） spectroscopy visible spectrum and four-point were investigated. X-ray diffraction showed that thin films crystallized in SnS2, SnS, and Sn2S3 phases, but the most prominent one is SnS_2. The results of the（UV） spectroscopy visible spectrum show that the film which was deposited at 4 min has a large transmittance of 60% in the visible region. The photoluminescence spectra exhibited the luminescent peaks in the visible region, which shows its potential application in photovoltaic devices. The electrical resistivity（ρ） values of SnxSy films have changed from 8.1×1064to 1.62Ω·cm with deposition time.
ISSN:1674-4926
DOI:10.1088/1674-4926/37/3/032001