Detection efficiency measurement of single photon avalanche photodiodes by using a focused monochromatic beam tunable from 250 nm to 1000 nm

We demonstrate the measurement of detection efficiency, the probability for the successful detection of a single photon incident on a detector, in a wide wavelength range from 250 nm to 1000 nm. The method is based on the responsivity comparison of two detectors by using a tunable monochromatic ligh...

Full description

Saved in:
Bibliographic Details
Published in:Metrologia 2019-06, Vol.56 (3), p.35003
Main Authors: Bae, In-Ho, Park, Seongchong, Hong, Kee-Suk, Park, Hee Su, Lee, Hee Jung, Moon, Han Seb, Borbely, Joseph Steven, Lee, Dong-Hoon
Format: Article
Language:English
Subjects:
Atoms & subatomic particles
Avalanche diodes
detection efficiency
Diodes
Efficiency
Light sources
Photodiodes
Photon avalanches
quantum radiometry
Sensors
single photon detector
Spatial filtering
Uncertainty
Wavelet transforms
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:We demonstrate the measurement of detection efficiency, the probability for the successful detection of a single photon incident on a detector, in a wide wavelength range from 250 nm to 1000 nm. The method is based on the responsivity comparison of two detectors by using a tunable monochromatic light source at a radiant power controlled to the pico-Watt level. As the reference detector, a photodiode with a switched integrating amplifier is used, whose spectral responsivity is calibrated at a photo-current level of pico-Ampere. A fibre-based spatial filter is used to form a beam focus that is focused to a diameter of less than 100 µm at the detector under test. The typical uncertainty of the detection-efficiency measurement for a Si-based single photon avalanche photodiode is evaluated to be less than 1% as a relative standard uncertainty (k  =  1), which is currently limited by the characteristics of the tunable source.
ISSN:0026-1394
1681-7575
DOI:10.1088/1681-7575/ab1d6c