Recrystallization and investigation of bismuth thin films by means of electron beam in transmission electron microscope

Thin bismuth films obtained by vacuum deposition were recrystallized under electron beam of scanning electron microscope at 5 kV and examined in a transmission electron microscope at 200 kV. In recrystallized films, various microstructures were detected: single-crystal, polycrystalline and amorphous...

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Bibliographic Details
Published in:Journal of physics. Conference series 2018-11, Vol.1115 (3), p.32087
Main Authors: Kolosov, V Yu, Yushkov, A A, Veretennikov, L M
Format: Article
Language:English
Subjects:
Bend strength
Bismuth
Crystal lattices
Crystallization
Crystals
Electron beams
Electron microscopes
Recrystallization
Single crystals
Thin films
Vacuum deposition
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Summary:Thin bismuth films obtained by vacuum deposition were recrystallized under electron beam of scanning electron microscope at 5 kV and examined in a transmission electron microscope at 200 kV. In recrystallized films, various microstructures were detected: single-crystal, polycrystalline and amorphous regions, more or less faceted grains, single crystals and untransparent drop-shaped particles. In the crystallized film, a strong internal bending of the crystal lattice is detected, up to 110 deg/μm.
ISSN:1742-6588
1742-6596
DOI:10.1088/1742-6596/1115/3/032087