Grazing Incidence X-Ray Diffraction using Synchrotron Light at SLRI

This work demonstrates the capability of the grazing incidence X-ray diffraction technique using synchrotron light. The measurement system is set up at the BL7.2W:MX beamline of the Synchrotron Light Research Institute (SLRI). The beamline utilizes hard X-rays from a 6.5-Tesla Superconducting Wavele...

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Bibliographic Details
Published in:Journal of physics. Conference series 2018-12, Vol.1144 (1), p.12052
Main Authors: Sripukdee, M, Songsiriritthigul, C, Mothong, N, Seawsakul, K, Saisopa, T, Horprathum, M, Songsiriritthigul, P
Format: Article
Language:English
Subjects:
Crystal structure
Crystals
Diffraction patterns
Electron beams
Grazing incidence
Light diffraction
Photons
Synchrotrons
Thickness
Thin films
X-ray diffraction
X-rays
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Summary:This work demonstrates the capability of the grazing incidence X-ray diffraction technique using synchrotron light. The measurement system is set up at the BL7.2W:MX beamline of the Synchrotron Light Research Institute (SLRI). The beamline utilizes hard X-rays from a 6.5-Tesla Superconducting Wavelength Shifter. The photon energy can be chosen between 7 to 18 keV with a photon flux of more than 1010 photons/sec at 100mA stored electron beam. The X-ray beam size can be reduced down to 20 microns, allowing XRD measurements in grazing geometry, thus crystal structures of very thin films with a thickness of tens nanometers can be identified. The diffraction patterns are recorded with a 2D CCD detector, allowing more diffraction spots of single crystalline films to be recorded.
ISSN:1742-6588
1742-6596
DOI:10.1088/1742-6596/1144/1/012052