CHARACTERIZATION OF BIDIRECTIONAL TRANSMISSIVE AND REFLECTIVE PROPERTIES OF BLACK SILICON

This paper describes the initial work of characterizing the transmissive and reflective properties of black silicon diffusers. The diffusers were fabricated from a 100 mm diameter black silicon sample at NASA’s Goddard Space Flight Center (GSFC). The directional hemispherical reflectance from 250 nm...

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Bibliographic Details
Published in:Journal of physics. Conference series 2022-01, Vol.2149 (1), p.12012
Main Authors: Georgiev, Georgi T., Butler, James J., Shiri, Ron, Jhabvala, Christine A.
Format: Article
Language:English
Subjects:
Diameters
Diffusers
Low level
Physics
Silicon
Space flight
Specular reflection
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Summary:This paper describes the initial work of characterizing the transmissive and reflective properties of black silicon diffusers. The diffusers were fabricated from a 100 mm diameter black silicon sample at NASA’s Goddard Space Flight Center (GSFC). The directional hemispherical reflectance from 250 nm to 2500 nm and BRDF/BTDF measurements at 632.8 nm, 1064 nm, and 1550 nm were measured using the GSFC Diffuser Calibration Laboratory’s (DCL) spectrophotometer and optical scatterometer. The diffusers exhibit a low level of specular reflection up to ~1100 nm with no evidence of retroscatter. The measurements are traceable to those made at the National Institute of Standards and Technology (NIST).
ISSN:1742-6588
1742-6596
DOI:10.1088/1742-6596/2149/1/012012