Ultra fine grained Ti prepared by severe plastic deformation

The positron annihilation spectroscopy was employed for characterisation of defects in pure Ti with ultra fine grained (UFG) structure. UFG Ti samples were prepared by two techniques based on severe plastic deformation (SPD): (i) high pressure torsion (HPT) and (ii) equal channel angular pressing (E...

Full description

Saved in:
Bibliographic Details
Published in:Journal of physics. Conference series 2016-01, Vol.674 (1), p.12007
Main Authors: Luká, F, í ek, J, Knapp, J, Procházka, I, Zhá al, P, Islamgaliev, R K
Format: Article
Language:English
Subjects:
Crystal defects
Equal channel angular pressing
Grain refinement
Hardness tests
Industrial applications
Mechanical properties
Physics
Plastic deformation
Positron annihilation
Spectroscopy
Spectrum analysis
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:The positron annihilation spectroscopy was employed for characterisation of defects in pure Ti with ultra fine grained (UFG) structure. UFG Ti samples were prepared by two techniques based on severe plastic deformation (SPD): (i) high pressure torsion (HPT) and (ii) equal channel angular pressing (ECAP). Although HPT is the most efficient technique for grain refinement, the size of HPT-deformed specimens is limited. On the other hand, ECAP is less efficient in grain refinement but enables to produce larger samples more suitable for industrial applications. Characterisation of defects by positron annihilation spectroscopy was accompanied by hardness testing in order to monitor the development of mechanical properties of UFG Ti.
ISSN:1742-6588
1742-6596
DOI:10.1088/1742-6596/674/1/012007