Characterization of multi-strip crystal deflector for high energy proton beams by synchrotron radiation topography with angular scanning

Currently, for extraction and collimation of proton beam at the large accelerators bent silicon single crystals are used. Recently the new device for multiple deflection of the proton beam was developed, it consists of several bent strips of silicon in the reflection mode. In the device the successi...

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Bibliographic Details
Published in:Journal of physics. Conference series 2016-07, Vol.732 (1), p.12029
Main Authors: Kaloyan, A A, Tikhomirov, S A, Podurets, K M, Chesnokov, Yu A, Sandomirskiy, Yu E
Format: Article
Language:English
Subjects:
Accelerators
Bending machines
Crystals
Grooves
Physics
Proton beams
Radiation
Residual stress
Scanning
Silicon
Single crystals
Synchrotron radiation
Synchrotrons
Thick plates
Topography
X ray topography
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Summary:Currently, for extraction and collimation of proton beam at the large accelerators bent silicon single crystals are used. Recently the new device for multiple deflection of the proton beam was developed, it consists of several bent strips of silicon in the reflection mode. In the device the successive bending of silicon strips at the surface of a thick plate is achieved due to internal stresses in the material of the crystal due to the Twyman effect as a result of applying mechanical grooves. Method of X-ray topography at synchrotron radiation with angular scanning was applied for measurement of bending of the individual strips of the deflector and the crystal as a whole. The results of the measurement are compared with the results obtained in the proton beam.
ISSN:1742-6588
1742-6596
DOI:10.1088/1742-6596/732/1/012029