Effect of the lead oxide content on the microstructure and properties of PZT films obtained by RF magnetron sputtering

Experimental studies of the influence of lead oxide as well as temperature and time of heat treatment on the microstructure and ferroelectric properties of PZT films obtained by the high-frequency magnetron sputtering method were carried out. It is shown that the change in the ferroelectric properti...

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Bibliographic Details
Published in:Journal of physics. Conference series 2017-07, Vol.872 (1), p.12045
Main Authors: Mukhin, N V, Chigirev, D A
Format: Article
Language:English
Subjects:
Crystals
Ferroelectric materials
Ferroelectricity
Heat treatment
Inclusions
Lead oxides
Lead zirconate titanates
Magnetic properties
Magnetron sputtering
Microstructure
Oxidation
Perovskite structure
Perovskites
Physics
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Summary:Experimental studies of the influence of lead oxide as well as temperature and time of heat treatment on the microstructure and ferroelectric properties of PZT films obtained by the high-frequency magnetron sputtering method were carried out. It is shown that the change in the ferroelectric properties of polycrystalline PZT films can be explained by their heterophase structure with inclusions of lead oxide. It was found that the presence of a sublayer of lead oxide leads to a self-polarization of the film of the PZT. During the formation of the perovskite structure, the diffusion of lead oxide to the surface of the film occurs more intensively than after its formation.
ISSN:1742-6588
1742-6596
DOI:10.1088/1742-6596/872/1/012045