A dedicated and versatile system for testing the radiation hardness of various integrated circuits

This work describes the architecture of a versatile system that is dedicated to the testing of various integrated circuits in radiation (e.g., ASICs, FPGAs). The system powers the device under test remotely. It monitors and reads out in real time various parameters, like: power consumption, voltage...

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Bibliographic Details
Published in:Journal of instrumentation 2023-01, Vol.18 (1), p.C01053
Main Authors: Placinta, V.M., Cojocariu, L.N., Maciuc, F.
Format: Article
Language:English
Subjects:
Data acquisition circuits
Digital electronic circuits
Ethernet
Graphical user interface
Integrated circuits
Parameters
Power consumption
Power management
Radiation damage to electronic components
Remote monitoring
Single event upsets
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Summary:This work describes the architecture of a versatile system that is dedicated to the testing of various integrated circuits in radiation (e.g., ASICs, FPGAs). The system powers the device under test remotely. It monitors and reads out in real time various parameters, like: power consumption, voltage and current (with resolution of 100 µV and 100 µA, respectively), specific operational parameters of the device under test and its package temperature. A key feature of this system is its multi-channel and remote power supply capabilities, used to power the device under test. It embeds built-in features to detect and record single-event latch-ups, single event upsets and to monitor total ionizing dose cumulative effects. A graphical user interface allows the user to connect and to control the entire system through a dedicated ethernet interface from a safe location zone, and record to disk measurements data.
ISSN:1748-0221
1748-0221
DOI:10.1088/1748-0221/18/01/C01053