Correlation between charge and current gain in LGADs treated with IR lasers

• Published in: Journal of instrumentation 2024-05, Vol.19 (5), p.P05071
• Main Authors: Ristić, Aleksandar, Kramberger, Gregor, Debevc, Jernej, Hiti, Bojan, Mandić, Igor, Skomina, Petja, Ristić, Goran
• Format: Article
• Language: English
• Subjects: Electric fields; Fluence; Incident radiation; Leakage current; PIN diodes; Si microstrip and pad detectors; Solid state detectors; Transient current
• ISSN: 1748-0221; 1748-0221
• DOI: 10.1088/1748-0221/19/05/P05071

This study investigates the correlation between the gain, defined as the increase of measured charge generated from the absorption of incident radiation, and the gain measured as the increase of sensor leakage current in Low Gain Avalanche Detectors (LGAD) before and after neutron irradiations. LGADs exhibit high signal-to-noise ratios for minimum ionizing particles and will be used in high-energy physics experiments, mainly related to timing applications. Transient Current Technique (TCT) measurements were conducted with LGADs and PIN diodes. The electric field screening effect, caused by free and trapped carriers, is identified as the main reason for the differences measured in gain determined from the increase in leakage current and collected charge. These effects are more significant in irradiated LGAD sensors. The experimental results confirm expectations, demonstrating a growing spread between the two measured gains with fluence. The study enables the prediction of charge gain from the leakage current measurements, which are easier to conduct.