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The Compatibility of NiO, CeO2 and NiO-CeO2 as a Coating on La0.6Sr0.4Co0.2Fe0.8O3-δ, La0.7Sr0.3Co0.2Fe0.8O3-δ and La0.7Sr0.3Mn0.3O3-δ Ceramic Membranes and Their Mechanical Properties
Metal oxides and perovskites have got tremendous attention as a good catalyst for partial oxidation of methane (POM). In the present work, the materials were cast into a double layer planar membrane using the dry pressing method in order to enhance its' catalytic activity. Unfortunately, the ma...
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Published in: | IOP conference series. Materials Science and Engineering 2018-05, Vol.367 (1) |
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Main Authors: | , , , , , , |
Format: | Article |
Language: | English |
Subjects: | |
Online Access: | Get full text |
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Summary: | Metal oxides and perovskites have got tremendous attention as a good catalyst for partial oxidation of methane (POM). In the present work, the materials were cast into a double layer planar membrane using the dry pressing method in order to enhance its' catalytic activity. Unfortunately, the majority of metal oxides and perovskites have different thermal expansion coefficient (TEC). Therefore, this work was aimed to study the compatibility between catalyst metal oxides (NiO, CeO2) and perovskite oxides La0.6Sr0.4Co0.2Fe0.8O3-δ (LSCF 6428), La0.7Sr0.3Co0.2Fe0.8O3-δ (LSCF 7328) and La0.7Sr0.3MnO3-δ (LSM 73) when they were made as double layer membranes. The result shows that the density and volume shrinkage of LSCF 7328 was the highest, followed by LSM 73 and LSCF 6428. It was also found that the trends of hardness and density in the perovskites and metal oxides follows their thermal expansion trends. According to thermomechanical analysis (TMA) results, TEC of LSCF 6428, LSCF 7328, LSM 73, NiO-CeO2, NiO and CeO2 were 22.16; 9.31; 10.14; 12.21; 20.86 and 21,11 ppm/°C, respectively. From the TEC data, Large differences in TEC cause the delamination of NiO, CeO and mixtures of NiO-CeO2 from perovskite surface except those who were prepared using amylum as a binder in the preparation of double layer membranes. |
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ISSN: | 1757-8981 1757-899X |
DOI: | 10.1088/1757-899X/367/1/012032 |