Linear correlation between the c-axis lattice constant and superconducting critical temperature in FeSe0.5Te0.5 thin films

Using x-ray diffraction, scanning electron microscopy, transmission electron microscopy, and electrical resistance analyses, we investigate structural and superconducting properties of FeSe0.5Te0.5 films deposited by pulsed laser deposition on TiO2-buffered (CeO2-buffered) SrTiO3 substrates with the...

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Bibliographic Details
Published in:Materials research express 2020-04, Vol.7 (4), p.046002
Main Authors: Huang, Jingfeng, Zhang, Yalin, Xing, Zhongwen, Gu, Min, Wang, Peng, Wang, Zhihe, Xing, Dingyu
Format: Article
Language:English
Subjects:
Buffer layers
Cerium oxides
Critical temperature
Electron microscopy
FeSe
FeSe0.5Te0.5
Film thickness
Lattice parameters
Microscopy
Pulsed laser deposition
Pulsed lasers
Strontium titanates
Substrates
Superconductivity
Thin films
Titanium dioxide
Transition temperature
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Summary:Using x-ray diffraction, scanning electron microscopy, transmission electron microscopy, and electrical resistance analyses, we investigate structural and superconducting properties of FeSe0.5Te0.5 films deposited by pulsed laser deposition on TiO2-buffered (CeO2-buffered) SrTiO3 substrates with the buffer film thickness varying from 0 to several tens of nanometers. It is found that the SrTiO3/TiO2 (or CeO2)/FeSe0.5Te0.5 film in a proper thickness range of the buffer film shows a higher superconducting transition temperature (Tc) than the SrTiO3/FeSe0.5Te0.5 film without buffer layer, indicating that the buffer layer can enhance Tc. Both Tc and the c-axis lattice constant of FeSe0.5Te0.5 films increase first and then decrease with the buffer film thickness, each exhibiting its maximum at a particular buffer film thickness, and both of them show an almost linear correlation.
ISSN:2053-1591
DOI:10.1088/2053-1591/ab8655