GISAXS Analysis for Ionomer Thin Films

An overview of GISAXS analysis for ionomer thin films is presented. Experimental procedures to prepare and measure thin films using GISAXS is described. Typical features of ionomer scattering images are discussed before detailing three different types of analysis which can be used in conjunction wit...

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Bibliographic Details
Published in:ECS transactions 2016-08, Vol.75 (14), p.643-650
Main Authors: Dudenas, Peter, Kusoglu, Ahmet, Hexemer, Alex, Weber, Adam Z
Format: Article
Language:English
Subjects:
INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY
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Summary:An overview of GISAXS analysis for ionomer thin films is presented. Experimental procedures to prepare and measure thin films using GISAXS is described. Typical features of ionomer scattering images are discussed before detailing three different types of analysis which can be used in conjunction with one another to elucidate additional information from scattering patterns. Example data are provided to illustrate these techniques.
ISSN:1938-5862
1938-6737
1938-6737
DOI:10.1149/07514.0643ecst