Calibrated force measurement in atomic force microscopy using the transient fluctuation theorem

The transient fluctuation theorem is used to calibrate an atomic force microscope by measuring the fluctuations of the work performed by a time-dependent force applied between a colloidal probe and the surface. From this measure one can easily extract the value of the interaction force and the relev...

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Bibliographic Details
Published in:Europhysics letters 2020-07, Vol.131 (1), p.10008
Main Authors: Albert, Samuel, Archambault, Aubin, Petrosyan, Artyom, Crauste-Thibierge, Caroline, Bellon, Ludovic, Ciliberto, Sergio
Format: Article
Language:English
Subjects:
Atomic force microscopy
Calibration
Condensed Matter
Force measurement
Physics
Statistical Mechanics
Theorems
Citations: Items that this one cites
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Summary:The transient fluctuation theorem is used to calibrate an atomic force microscope by measuring the fluctuations of the work performed by a time-dependent force applied between a colloidal probe and the surface. From this measure one can easily extract the value of the interaction force and the relevant parameters of the cantilever. The results of this analysis are compared with those obtained by standard calibration methods.
ISSN:0295-5075
1286-4854
1286-4854
DOI:10.1209/0295-5075/131/10008