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Measurement of shunt resistance and conduction band offset in Cu(In, Ga)Se2 solar cells through joint analysis of temperature and intensity dependence of open-circuit voltage and photoluminescence
Joint analysis studies of open-circuit voltage and photoluminescence intensity (PL-I) are reported for CuIn1−xGaxSe2 (CIGSe) solar cells. A range of compositions are investigated, including constant x = 0.35 and x = 0.55 as well as a graded composition profile having a minimum of x = 0.25. Both the...
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Published in: | Japanese Journal of Applied Physics 2020-05, Vol.59 (5) |
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creator | Swartz, Craig H. Paul, Sanjoy Mansfield, Lorelle M. Li, Jian V. Holtz, Mark W. |
description | Joint analysis studies of open-circuit voltage and photoluminescence intensity (PL-I) are reported for CuIn1−xGaxSe2 (CIGSe) solar cells. A range of compositions are investigated, including constant x = 0.35 and x = 0.55 as well as a graded composition profile having a minimum of x = 0.25. Both the open-circuit voltage and PL-I are measured as functions of temperature and illumination intensity. With these two measurements, a full model-based fitting of the temperature and illumination dependence allows extraction of the effects of window layer band offset and shunt resistance, in addition to bulk and interface recombination parameters. To quantitatively analyze the two distinct measurements jointly, the absolute PL-I is measured to obtain quasi-Fermi-level splitting. |
doi_str_mv | 10.35848/1347-4065/ab89f8 |
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(NREL), Golden, CO (United States) ; Texas State Univ., San Marcos, TX (United States)</creatorcontrib><description>Joint analysis studies of open-circuit voltage and photoluminescence intensity (PL-I) are reported for CuIn1−xGaxSe2 (CIGSe) solar cells. A range of compositions are investigated, including constant x = 0.35 and x = 0.55 as well as a graded composition profile having a minimum of x = 0.25. Both the open-circuit voltage and PL-I are measured as functions of temperature and illumination intensity. With these two measurements, a full model-based fitting of the temperature and illumination dependence allows extraction of the effects of window layer band offset and shunt resistance, in addition to bulk and interface recombination parameters. To quantitatively analyze the two distinct measurements jointly, the absolute PL-I is measured to obtain quasi-Fermi-level splitting.</description><identifier>ISSN: 0021-4922</identifier><identifier>EISSN: 1347-4065</identifier><identifier>DOI: 10.35848/1347-4065/ab89f8</identifier><identifier>CODEN: JJAPB6</identifier><language>eng</language><publisher>United States: IOP Publishing</publisher><subject>band offset ; CIGS ; CIGSe ; Cu(In,Ga)Se2 ; illumination dependent open-circuit voltage ; illumination dependent photoluminescence intensity ; Injection dependence ; Photovoltaic device characterization ; quasi-Fermi-level splitting ; Shockley-Read-Hall ; SOLAR ENERGY ; SRH recombination ; temperature dependent open-circuit voltage ; temperature dependent photoluminescence intensity ; Voc</subject><ispartof>Japanese Journal of Applied Physics, 2020-05, Vol.59 (5)</ispartof><rights>2020 The Japan Society of Applied Physics</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><orcidid>0000-0002-3046-7985 ; 0000-0002-1509-0382 ; 0000000215090382 ; 0000000230467985</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://iopscience.iop.org/article/10.35848/1347-4065/ab89f8/pdf$$EPDF$$P50$$Giop$$H</linktopdf><link.rule.ids>230,314,776,780,881,27903,27904,38847,53819</link.rule.ids><backlink>$$Uhttps://www.osti.gov/servlets/purl/1615907$$D View this record in Osti.gov$$Hfree_for_read</backlink></links><search><creatorcontrib>Swartz, Craig H.</creatorcontrib><creatorcontrib>Paul, Sanjoy</creatorcontrib><creatorcontrib>Mansfield, Lorelle M.</creatorcontrib><creatorcontrib>Li, Jian V.</creatorcontrib><creatorcontrib>Holtz, Mark W.</creatorcontrib><creatorcontrib>National Renewable Energy Lab. (NREL), Golden, CO (United States)</creatorcontrib><creatorcontrib>Texas State Univ., San Marcos, TX (United States)</creatorcontrib><title>Measurement of shunt resistance and conduction band offset in Cu(In, Ga)Se2 solar cells through joint analysis of temperature and intensity dependence of open-circuit voltage and photoluminescence</title><title>Japanese Journal of Applied Physics</title><addtitle>Jpn. J. Appl. Phys</addtitle><description>Joint analysis studies of open-circuit voltage and photoluminescence intensity (PL-I) are reported for CuIn1−xGaxSe2 (CIGSe) solar cells. A range of compositions are investigated, including constant x = 0.35 and x = 0.55 as well as a graded composition profile having a minimum of x = 0.25. Both the open-circuit voltage and PL-I are measured as functions of temperature and illumination intensity. With these two measurements, a full model-based fitting of the temperature and illumination dependence allows extraction of the effects of window layer band offset and shunt resistance, in addition to bulk and interface recombination parameters. To quantitatively analyze the two distinct measurements jointly, the absolute PL-I is measured to obtain quasi-Fermi-level splitting.</description><subject>band offset</subject><subject>CIGS</subject><subject>CIGSe</subject><subject>Cu(In,Ga)Se2</subject><subject>illumination dependent open-circuit voltage</subject><subject>illumination dependent photoluminescence intensity</subject><subject>Injection dependence</subject><subject>Photovoltaic device characterization</subject><subject>quasi-Fermi-level splitting</subject><subject>Shockley-Read-Hall</subject><subject>SOLAR ENERGY</subject><subject>SRH recombination</subject><subject>temperature dependent open-circuit voltage</subject><subject>temperature dependent photoluminescence intensity</subject><subject>Voc</subject><issn>0021-4922</issn><issn>1347-4065</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2020</creationdate><recordtype>article</recordtype><recordid>eNptkU1PHSEYhUljk15tf0B3pCtNOsrnfCybG6smGhdt14SBF4fJXJgMTBP_X39YGa9x5QoOPO85gYPQV0ouuWxFe0W5aCpBanml-7Zz7Qe0ezs6QTtCGK1Ex9gndJrSWGQtBd2hfw-g07rAAULG0eE0rGWzQPIp62AA62CxicGuJvsYcL_p6FyCjH3A-_X8LnzHN_riFzCc4qQXbGCaEs7DEtenAY_RF0Md9PRcPLeIDIcZFp1L6ot7uYeQfH7GFmYIFrbYwsUiKuMXs_qM_8Yp66fjwDzEHKf14AMks9Gf0UenpwRfXtcz9Ofn9e_9bXX_eHO3_3FfedbVuZIN41L0VDvJrelYY4UWpnOEt13f1IYw4DVvqLO1ZUbolmsKjJSBXjhHNT9D346-MWWvkvEZzFA-J4DJitZUdqQp0PkR8nFWY1yX8vSkxlHPSnZKKiKlJELN1hW0egelRL1Uqrb-1NafOlbK_wO61pjn</recordid><startdate>20200501</startdate><enddate>20200501</enddate><creator>Swartz, Craig H.</creator><creator>Paul, Sanjoy</creator><creator>Mansfield, Lorelle M.</creator><creator>Li, Jian V.</creator><creator>Holtz, Mark W.</creator><general>IOP Publishing</general><general>Japan Society of Applied Physics</general><scope>OIOZB</scope><scope>OTOTI</scope><orcidid>https://orcid.org/0000-0002-3046-7985</orcidid><orcidid>https://orcid.org/0000-0002-1509-0382</orcidid><orcidid>https://orcid.org/0000000215090382</orcidid><orcidid>https://orcid.org/0000000230467985</orcidid></search><sort><creationdate>20200501</creationdate><title>Measurement of shunt resistance and conduction band offset in Cu(In, Ga)Se2 solar cells through joint analysis of temperature and intensity dependence of open-circuit voltage and photoluminescence</title><author>Swartz, Craig H. ; Paul, Sanjoy ; Mansfield, Lorelle M. ; Li, Jian V. ; Holtz, Mark W.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i296t-572354b1af53dc927d4a4c9f0389b76c02e36371fd6d2c4a83a1e20b1ab4ff1a3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2020</creationdate><topic>band offset</topic><topic>CIGS</topic><topic>CIGSe</topic><topic>Cu(In,Ga)Se2</topic><topic>illumination dependent open-circuit voltage</topic><topic>illumination dependent photoluminescence intensity</topic><topic>Injection dependence</topic><topic>Photovoltaic device characterization</topic><topic>quasi-Fermi-level splitting</topic><topic>Shockley-Read-Hall</topic><topic>SOLAR ENERGY</topic><topic>SRH recombination</topic><topic>temperature dependent open-circuit voltage</topic><topic>temperature dependent photoluminescence intensity</topic><topic>Voc</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Swartz, Craig H.</creatorcontrib><creatorcontrib>Paul, Sanjoy</creatorcontrib><creatorcontrib>Mansfield, Lorelle M.</creatorcontrib><creatorcontrib>Li, Jian V.</creatorcontrib><creatorcontrib>Holtz, Mark W.</creatorcontrib><creatorcontrib>National Renewable Energy Lab. (NREL), Golden, CO (United States)</creatorcontrib><creatorcontrib>Texas State Univ., San Marcos, TX (United States)</creatorcontrib><collection>OSTI.GOV - Hybrid</collection><collection>OSTI.GOV</collection><jtitle>Japanese Journal of Applied Physics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Swartz, Craig H.</au><au>Paul, Sanjoy</au><au>Mansfield, Lorelle M.</au><au>Li, Jian V.</au><au>Holtz, Mark W.</au><aucorp>National Renewable Energy Lab. (NREL), Golden, CO (United States)</aucorp><aucorp>Texas State Univ., San Marcos, TX (United States)</aucorp><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Measurement of shunt resistance and conduction band offset in Cu(In, Ga)Se2 solar cells through joint analysis of temperature and intensity dependence of open-circuit voltage and photoluminescence</atitle><jtitle>Japanese Journal of Applied Physics</jtitle><addtitle>Jpn. J. Appl. Phys</addtitle><date>2020-05-01</date><risdate>2020</risdate><volume>59</volume><issue>5</issue><issn>0021-4922</issn><eissn>1347-4065</eissn><coden>JJAPB6</coden><abstract>Joint analysis studies of open-circuit voltage and photoluminescence intensity (PL-I) are reported for CuIn1−xGaxSe2 (CIGSe) solar cells. A range of compositions are investigated, including constant x = 0.35 and x = 0.55 as well as a graded composition profile having a minimum of x = 0.25. Both the open-circuit voltage and PL-I are measured as functions of temperature and illumination intensity. With these two measurements, a full model-based fitting of the temperature and illumination dependence allows extraction of the effects of window layer band offset and shunt resistance, in addition to bulk and interface recombination parameters. 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subjects | band offset CIGS CIGSe Cu(In,Ga)Se2 illumination dependent open-circuit voltage illumination dependent photoluminescence intensity Injection dependence Photovoltaic device characterization quasi-Fermi-level splitting Shockley-Read-Hall SOLAR ENERGY SRH recombination temperature dependent open-circuit voltage temperature dependent photoluminescence intensity Voc |
title | Measurement of shunt resistance and conduction band offset in Cu(In, Ga)Se2 solar cells through joint analysis of temperature and intensity dependence of open-circuit voltage and photoluminescence |
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