Development of a method for analyzing the positional correlation of local structures in scanning probe microscopy images using template-matching image-processing method

The functionalities of materials are governed by the atom type and arrangement, and perturbations caused by defects and adsorbate interactions often significantly alter the behavior of materials. Scanning probe microscopy (SPM) can capture complex interactions caused by the structures on surfaces. I...

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Bibliographic Details
Published in:Applied physics express 2024-03, Vol.17 (3), p.35003
Main Authors: Tsubokura, Sota, Kawano, Shoya, Imai, Yumiko, Ueda, Tadashi, Nakamoto, Kei-ichi, Noma, Haruo, Hioki, Hirohisa, Minato, Taketoshi
Format: Article
Language:English
Subjects:
atomic force microscopy
image processing
interface
scanning probe microscopy
scanning tunneling microscopy
surface
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Summary:The functionalities of materials are governed by the atom type and arrangement, and perturbations caused by defects and adsorbate interactions often significantly alter the behavior of materials. Scanning probe microscopy (SPM) can capture complex interactions caused by the structures on surfaces. It is, however, difficult to analyze such interactions appearing there. In this paper, an image-processing technique that employs template matching to recognize local structures in SPM images and calculate positional correlations is reported. This approach opens new avenues for investigating intricate perturbations in the sciences and provides detailed insights into materials science.
ISSN:1882-0778
1882-0786
DOI:10.35848/1882-0786/ad2784