Loading…

Investigation of the effect of nitride-based LEDs fabricated using hole injection layer at different growth temperatures

In this study, the fabrication of blue InGaN/GaN light-emitting diodes (LEDs) using a hole injection layer (HIL) grown at different temperatures was demonstrated and the LEDs were investigated. The LEDs with HIL grown at 870 °C show a higher light output power and a lower efficiency droop ratio. Thi...

Full description

Saved in:
Bibliographic Details
Published in:Japanese Journal of Applied Physics 2016-05, Vol.55 (5S), p.5
Main Authors: Wang, Shih-Wei, Wang, Chun-Kai, Chang, Shoou-Jinn, Chiou, Yu-Zung, Chiang, Kuo-Wei, Jheng, Jie-Si, Chang, Sheng-Po
Format: Article
Language:English
Citations: Items that this one cites
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
cited_by
cites cdi_FETCH-LOGICAL-c329t-c2983197c7d1b054e2d43b61a17bbec3fa5d25f6c0722fde44304cfda01140f23
container_end_page
container_issue 5S
container_start_page 5
container_title Japanese Journal of Applied Physics
container_volume 55
creator Wang, Shih-Wei
Wang, Chun-Kai
Chang, Shoou-Jinn
Chiou, Yu-Zung
Chiang, Kuo-Wei
Jheng, Jie-Si
Chang, Sheng-Po
description In this study, the fabrication of blue InGaN/GaN light-emitting diodes (LEDs) using a hole injection layer (HIL) grown at different temperatures was demonstrated and the LEDs were investigated. The LEDs with HIL grown at 870 °C show a higher light output power and a lower efficiency droop ratio. This can be attributed to the improvement of the spontaneous and piezoelectric polarization-induced field effects [i.e., quantum-confined stark effect (QCSE)] of LEDs. However, the growth temperature of HIL at 840 °C was very low and resulted in excessive Mg atom doping, which would cause point defect generation and rapid hole concentration drop. On the other hand, the LEDs with HIL grown at 900 °C exhibit better electrostatic discharge (ESD) endurance and higher hot/cold factors owing to the lower defect density. Overall, the LEDs with HIL grown at 870 °C show better properties than the other LEDs.
doi_str_mv 10.7567/JJAP.55.05FJ14
format article
fullrecord <record><control><sourceid>iop_cross</sourceid><recordid>TN_cdi_iop_journals_10_7567_JJAP_55_05FJ14</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>GN15077</sourcerecordid><originalsourceid>FETCH-LOGICAL-c329t-c2983197c7d1b054e2d43b61a17bbec3fa5d25f6c0722fde44304cfda01140f23</originalsourceid><addsrcrecordid>eNp1kEFLwzAYhoMoOKdXz7kqtCZp0trjmJtuDBTUc0iTL1vK1pYkU_fvbdmOevp44XkfPl6EbilJC5EXD8vl5C0VIiVivqT8DI1oxouEk1ycoxEhjCa8ZOwSXYVQ9zEXnI7Qz6L5ghDdWkXXNri1OG4Ag7Wg45AaF70zkFQqgMGr2VPAVlXeaRX7vA-uWeNNuwXsmrqvDI6tOoDHKmLjeo2HJuK1b7_jBkfYdeBV3HsI1-jCqm2Am9Mdo8_57GP6kqxenxfTySrRGStjoln5mNGy0IWhFREcmOFZlVNFi6oCnVklDBM216RgzBrgPCNcW6MIpZxYlo1RevRq34bgwcrOu53yB0mJHHaTw25SCHncrS_cHQuu7WTd7n3TvyfrWnUDJN5PnOyM7dn7P9h_xL9RSn6L</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Investigation of the effect of nitride-based LEDs fabricated using hole injection layer at different growth temperatures</title><source>IOPscience journals</source><source>Institute of Physics:Jisc Collections:IOP Publishing Read and Publish 2024-2025 (Reading List)</source><creator>Wang, Shih-Wei ; Wang, Chun-Kai ; Chang, Shoou-Jinn ; Chiou, Yu-Zung ; Chiang, Kuo-Wei ; Jheng, Jie-Si ; Chang, Sheng-Po</creator><creatorcontrib>Wang, Shih-Wei ; Wang, Chun-Kai ; Chang, Shoou-Jinn ; Chiou, Yu-Zung ; Chiang, Kuo-Wei ; Jheng, Jie-Si ; Chang, Sheng-Po</creatorcontrib><description>In this study, the fabrication of blue InGaN/GaN light-emitting diodes (LEDs) using a hole injection layer (HIL) grown at different temperatures was demonstrated and the LEDs were investigated. The LEDs with HIL grown at 870 °C show a higher light output power and a lower efficiency droop ratio. This can be attributed to the improvement of the spontaneous and piezoelectric polarization-induced field effects [i.e., quantum-confined stark effect (QCSE)] of LEDs. However, the growth temperature of HIL at 840 °C was very low and resulted in excessive Mg atom doping, which would cause point defect generation and rapid hole concentration drop. On the other hand, the LEDs with HIL grown at 900 °C exhibit better electrostatic discharge (ESD) endurance and higher hot/cold factors owing to the lower defect density. Overall, the LEDs with HIL grown at 870 °C show better properties than the other LEDs.</description><identifier>ISSN: 0021-4922</identifier><identifier>EISSN: 1347-4065</identifier><identifier>DOI: 10.7567/JJAP.55.05FJ14</identifier><identifier>CODEN: JJAPB6</identifier><language>eng</language><publisher>The Japan Society of Applied Physics</publisher><ispartof>Japanese Journal of Applied Physics, 2016-05, Vol.55 (5S), p.5</ispartof><rights>2016 The Japan Society of Applied Physics</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><cites>FETCH-LOGICAL-c329t-c2983197c7d1b054e2d43b61a17bbec3fa5d25f6c0722fde44304cfda01140f23</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://iopscience.iop.org/article/10.7567/JJAP.55.05FJ14/pdf$$EPDF$$P50$$Giop$$H</linktopdf><link.rule.ids>314,776,780,27903,27904,38847,53818</link.rule.ids></links><search><creatorcontrib>Wang, Shih-Wei</creatorcontrib><creatorcontrib>Wang, Chun-Kai</creatorcontrib><creatorcontrib>Chang, Shoou-Jinn</creatorcontrib><creatorcontrib>Chiou, Yu-Zung</creatorcontrib><creatorcontrib>Chiang, Kuo-Wei</creatorcontrib><creatorcontrib>Jheng, Jie-Si</creatorcontrib><creatorcontrib>Chang, Sheng-Po</creatorcontrib><title>Investigation of the effect of nitride-based LEDs fabricated using hole injection layer at different growth temperatures</title><title>Japanese Journal of Applied Physics</title><addtitle>Jpn. J. Appl. Phys</addtitle><description>In this study, the fabrication of blue InGaN/GaN light-emitting diodes (LEDs) using a hole injection layer (HIL) grown at different temperatures was demonstrated and the LEDs were investigated. The LEDs with HIL grown at 870 °C show a higher light output power and a lower efficiency droop ratio. This can be attributed to the improvement of the spontaneous and piezoelectric polarization-induced field effects [i.e., quantum-confined stark effect (QCSE)] of LEDs. However, the growth temperature of HIL at 840 °C was very low and resulted in excessive Mg atom doping, which would cause point defect generation and rapid hole concentration drop. On the other hand, the LEDs with HIL grown at 900 °C exhibit better electrostatic discharge (ESD) endurance and higher hot/cold factors owing to the lower defect density. Overall, the LEDs with HIL grown at 870 °C show better properties than the other LEDs.</description><issn>0021-4922</issn><issn>1347-4065</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2016</creationdate><recordtype>article</recordtype><recordid>eNp1kEFLwzAYhoMoOKdXz7kqtCZp0trjmJtuDBTUc0iTL1vK1pYkU_fvbdmOevp44XkfPl6EbilJC5EXD8vl5C0VIiVivqT8DI1oxouEk1ycoxEhjCa8ZOwSXYVQ9zEXnI7Qz6L5ghDdWkXXNri1OG4Ag7Wg45AaF70zkFQqgMGr2VPAVlXeaRX7vA-uWeNNuwXsmrqvDI6tOoDHKmLjeo2HJuK1b7_jBkfYdeBV3HsI1-jCqm2Am9Mdo8_57GP6kqxenxfTySrRGStjoln5mNGy0IWhFREcmOFZlVNFi6oCnVklDBM216RgzBrgPCNcW6MIpZxYlo1RevRq34bgwcrOu53yB0mJHHaTw25SCHncrS_cHQuu7WTd7n3TvyfrWnUDJN5PnOyM7dn7P9h_xL9RSn6L</recordid><startdate>20160501</startdate><enddate>20160501</enddate><creator>Wang, Shih-Wei</creator><creator>Wang, Chun-Kai</creator><creator>Chang, Shoou-Jinn</creator><creator>Chiou, Yu-Zung</creator><creator>Chiang, Kuo-Wei</creator><creator>Jheng, Jie-Si</creator><creator>Chang, Sheng-Po</creator><general>The Japan Society of Applied Physics</general><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>20160501</creationdate><title>Investigation of the effect of nitride-based LEDs fabricated using hole injection layer at different growth temperatures</title><author>Wang, Shih-Wei ; Wang, Chun-Kai ; Chang, Shoou-Jinn ; Chiou, Yu-Zung ; Chiang, Kuo-Wei ; Jheng, Jie-Si ; Chang, Sheng-Po</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c329t-c2983197c7d1b054e2d43b61a17bbec3fa5d25f6c0722fde44304cfda01140f23</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2016</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Wang, Shih-Wei</creatorcontrib><creatorcontrib>Wang, Chun-Kai</creatorcontrib><creatorcontrib>Chang, Shoou-Jinn</creatorcontrib><creatorcontrib>Chiou, Yu-Zung</creatorcontrib><creatorcontrib>Chiang, Kuo-Wei</creatorcontrib><creatorcontrib>Jheng, Jie-Si</creatorcontrib><creatorcontrib>Chang, Sheng-Po</creatorcontrib><collection>CrossRef</collection><jtitle>Japanese Journal of Applied Physics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Wang, Shih-Wei</au><au>Wang, Chun-Kai</au><au>Chang, Shoou-Jinn</au><au>Chiou, Yu-Zung</au><au>Chiang, Kuo-Wei</au><au>Jheng, Jie-Si</au><au>Chang, Sheng-Po</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Investigation of the effect of nitride-based LEDs fabricated using hole injection layer at different growth temperatures</atitle><jtitle>Japanese Journal of Applied Physics</jtitle><addtitle>Jpn. J. Appl. Phys</addtitle><date>2016-05-01</date><risdate>2016</risdate><volume>55</volume><issue>5S</issue><spage>5</spage><pages>5-</pages><issn>0021-4922</issn><eissn>1347-4065</eissn><coden>JJAPB6</coden><abstract>In this study, the fabrication of blue InGaN/GaN light-emitting diodes (LEDs) using a hole injection layer (HIL) grown at different temperatures was demonstrated and the LEDs were investigated. The LEDs with HIL grown at 870 °C show a higher light output power and a lower efficiency droop ratio. This can be attributed to the improvement of the spontaneous and piezoelectric polarization-induced field effects [i.e., quantum-confined stark effect (QCSE)] of LEDs. However, the growth temperature of HIL at 840 °C was very low and resulted in excessive Mg atom doping, which would cause point defect generation and rapid hole concentration drop. On the other hand, the LEDs with HIL grown at 900 °C exhibit better electrostatic discharge (ESD) endurance and higher hot/cold factors owing to the lower defect density. Overall, the LEDs with HIL grown at 870 °C show better properties than the other LEDs.</abstract><pub>The Japan Society of Applied Physics</pub><doi>10.7567/JJAP.55.05FJ14</doi><tpages>4</tpages></addata></record>
fulltext fulltext
identifier ISSN: 0021-4922
ispartof Japanese Journal of Applied Physics, 2016-05, Vol.55 (5S), p.5
issn 0021-4922
1347-4065
language eng
recordid cdi_iop_journals_10_7567_JJAP_55_05FJ14
source IOPscience journals; Institute of Physics:Jisc Collections:IOP Publishing Read and Publish 2024-2025 (Reading List)
title Investigation of the effect of nitride-based LEDs fabricated using hole injection layer at different growth temperatures
url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-27T18%3A38%3A25IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-iop_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Investigation%20of%20the%20effect%20of%20nitride-based%20LEDs%20fabricated%20using%20hole%20injection%20layer%20at%20different%20growth%20temperatures&rft.jtitle=Japanese%20Journal%20of%20Applied%20Physics&rft.au=Wang,%20Shih-Wei&rft.date=2016-05-01&rft.volume=55&rft.issue=5S&rft.spage=5&rft.pages=5-&rft.issn=0021-4922&rft.eissn=1347-4065&rft.coden=JJAPB6&rft_id=info:doi/10.7567/JJAP.55.05FJ14&rft_dat=%3Ciop_cross%3EGN15077%3C/iop_cross%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c329t-c2983197c7d1b054e2d43b61a17bbec3fa5d25f6c0722fde44304cfda01140f23%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true