Effect of the dielectric layer thickness on the electromagnetic response of cut-wire-pair and combined structures

• Published in: Journal of physics. D, Applied physics Applied physics, 2009-06, Vol.42 (11), p.115404-115404 (8)
• Main Authors: Lam, V D, Tung, N T, Cho, M H, Park, J W, Jang, W H, Lee, Y P
• Format: Article
• Language: English
• Subjects: Condensed matter: electronic structure, electrical, magnetic, and optical properties; Dielectric loss and relaxation; Dielectric properties of solids and liquids; Dielectric thin films; Dielectrics, piezoelectrics, and ferroelectrics and their properties; Exact sciences and technology; General theory of resonances and relaxations; Magnetic resonances and relaxations in condensed matter, mössbauer effect; Physics
• ISSN: 0022-3727; 1361-6463
• DOI: 10.1088/0022-3727/42/11/115404

This report investigates the effect of the dielectric layer thickness on both magnetic and electric resonances of cut-wire-pair (CWP) structures in the microwave frequency regime. It was found that the resonances are sensitive to the thickness of the dielectric layer. As the thickness increases, the bandwidth of the magnetic resonance is slightly extended to a higher frequency, while the low-frequency edge of the electric-resonance band is remarkably shifted to a lower frequency. It was also found that the dependence of the magnetic resonance frequency on the dielectric layer thickness follows the trend of the closed formula based on the cavity model for the coupled metallic elements (Cai et al 2007 Opt. Express 15 3333). In addition, we also studied the effect of the dielectric layer thickness on the left-handed behaviour of a combined structure consisting of CWP and continuous wire. The actual measurements are compared with the numerical simulation values to show a good coincidence.