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Inductance deep-level transient spectroscopy for determining temperature-dependent resistance and capacitance of Schottky diodes

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Bibliographic Details
Published in:Physica scripta 2004-01, Vol.2004, p.16-17
Main Authors: Rangel-Kuoppa, V T, Pessa, M
Format: Article
Language:English
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ISSN:1402-4896
0031-8949
1402-4896
DOI:10.1088/0031-8949/2004/T114/003