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Kinetics of wet oxidation at 1000 °C of Si0.5Ge0.5 relaxed alloy

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Bibliographic Details
Published in:Semiconductor science and technology 1999-05, Vol.14 (5), p.484-487
Main Authors: Zhang, J P, Hemment, P L F, Parker, E H C
Format: Article
Language:English
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ISSN:0268-1242
1361-6641
DOI:10.1088/0268-1242/14/5/319