The effect of ionization threshold softness on the temperature dependence of the impact ionization coefficient

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Bibliographic Details
Published in:Semiconductor science and technology 2003-07, Vol.18 (7), p.689-692
Main Authors: Groves, C, David, J P R, Rees, G J
Format: Article
Language:English
Subjects:
Applied sciences
Condensed matter: electronic structure, electrical, magnetic, and optical properties
Electron and ion emission by liquids and solids
impact phenomena
Electronics
Exact sciences and technology
Field emission, ionization, evaporation, and desorption
Optoelectronic devices
Photodiodes
phototransistors
photoresistors
Physics
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
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ISSN:0268-1242
1361-6641
DOI:10.1088/0268-1242/18/7/316