A proposal for both plasma ion- and electron-temperature diagnostics under simultaneous incidence of particles and x-rays into a semiconductor on the basis of a proposed model for a semiconductor detector response

Saved in:
Bibliographic Details
Published in:Plasma physics and controlled fusion 2003-05, Vol.45 (5), p.807-821
Main Authors: Numakura, T, Cho, T, Kohagura, J, Hirata, M, Minami, R, Yoshida, M, Nakashima, Y, Tamano, T, Yatsu, K, Miyoshi, S
Format: Article
Language:English
Subjects:
Exact sciences and technology
Magnetic confinement and equilibrium
Magnetic mirrors
Particle measurements
Physics
Physics of gases, plasmas and electric discharges
Physics of plasmas and electric discharges
Plasma diagnostic techniques and instrumentation
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:
ISSN:0741-3335
1361-6587
DOI:10.1088/0741-3335/45/5/321