Fourier-transform infrared reflection study of the morphology of porous semiconductor structures

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Bibliographic Details
Published in:Journal of physics. Condensed matter 2000-04, Vol.12 (16), p.3897-3900
Main Authors: Belogorokhov, A, Pusep, Yu A, Belogorokhova, L
Format: Article
Language:English
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ISSN:0953-8984
1361-648X
DOI:10.1088/0953-8984/12/16/311