Photoluminescence characterization of defects in Si and SiGe structures

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Bibliographic Details
Published in:Journal of physics. Condensed matter 2000-12, Vol.12 (49), p.10105-10121
Main Authors: Higgs, V, Chin, F, Wang, X, Mosalski, J, Beanland, R
Format: Article
Language:English
Subjects:
Condensed matter: electronic structure, electrical, magnetic, and optical properties
Condensed matter: structure, mechanical and thermal properties
Defects and impurities in crystals
microstructure
Elemental semiconductors
Exact sciences and technology
Linear defects: dislocations, disclinations
Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation
Photoluminescence
Physics
Structure of solids and liquids
crystallography
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ISSN:0953-8984
1361-648X
DOI:10.1088/0953-8984/12/49/310