Secondary electron focusing in a metastable surface-detector

A general purpose metastable surface detector is described which incorporates a novel design feature for focusing ejected secondary electrons from the surface into a channel electron multiplier (CEM). In this case, the 6 eV metastable state in CO(a\+3\-\#P\) was selected as the test species. The thr...

Full description

Saved in:
Bibliographic Details
Published in:Measurement science & technology 1996-04, Vol.7 (4), p.641-649
Main Authors: Furlong, J M, Newell, W R
Format: Article
Language:English
Subjects:
Atomic and molecular beam sources and detectors
Atomic, molecular and charged-particle sources and detectors
Exact sciences and technology
Instruments, apparatus, components and techniques common to several branches of physics and astronomy
Physics
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:A general purpose metastable surface detector is described which incorporates a novel design feature for focusing ejected secondary electrons from the surface into a channel electron multiplier (CEM). In this case, the 6 eV metastable state in CO(a\+3\-\#P\) was selected as the test species. The three surfaces used were beryllium-copper, hafnium and the surface of a CEM detector (lead-silicate glass). (Abstract quotes from original text)
ISSN:0957-0233
1361-6501
DOI:10.1088/0957-0233/7/4/022