Quantitative measurement of solvation shells using frequency modulated atomic force microscopy

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Bibliographic Details
Published in:Nanotechnology 2005-03, Vol.16 (3), p.S49-S53
Main Authors: Uchihashi, T, Higgins, M, Nakayama, Y, Sader, J E, Jarvis, S P
Format: Article
Language:English
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ISSN:0957-4484
1361-6528
DOI:10.1088/0957-4484/16/3/009