Compact phase-contrast soft X-ray microscopy

For nearly all elements, the real part, d, of the complex index of refraction n (n 1 − δ + iβ) is larger than the imaginary part, β, in the x-ray region. Since only β is used in absorption contrast, phase-contrast imaging techniques which give access to δ are very important. In this paper we present...

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Bibliographic Details
Published in:Journal of physics. Conference series 2009-09, Vol.186 (1), p.012038
Main Authors: Hofsten, O von, Bertilson, M, Lindblom, M, Holmberg, A, Hertz, H M, Vogt, U
Format: Article
Language:English
Subjects:
DIFFRACTIVE OPTICAL-ELEMENTS
Fysik
Imaging techniques
Microscopes
NATURAL SCIENCES
NATURVETENSKAP
Phase contrast
Physics
Refractivity
Soft x rays
X ray microscopy
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Summary:For nearly all elements, the real part, d, of the complex index of refraction n (n 1 − δ + iβ) is larger than the imaginary part, β, in the x-ray region. Since only β is used in absorption contrast, phase-contrast imaging techniques which give access to δ are very important. In this paper we present two different implementations of phase contrast in our compact soft x-ray microscope, differential-interference contrast and Zernike phase contrast.
ISSN:1742-6596
1742-6588
1742-6596
DOI:10.1088/1742-6596/186/1/012038