The application of spherical aberration correction and focal series restoration to high-resolution images of platinum nanocatalyst particles

A JEOL 2200FS transmission electron microscope equipped with a field emission gun, an objective lens spherical aberration corrector and an in-column energy filter has been used to acquire through focal series of high-resolution images of platinum nanocatalyst particles using a small value of the sph...

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Bibliographic Details
Published in:Journal of physics. Conference series 2006-02, Vol.26 (1), p.25-28
Main Authors: Gontard, L Cervera, Chang, L-Y, Dunin-Borkowski, R E, Kirkland, A I, Hetherington, C J D, Ozkaya, D
Format: Article
Language:English
Subjects:
Aberration
Electron microscopes
Field emission
High resolution
Image acquisition
Image quality
Image resolution
Image transmission
Physics
Platinum
Restoration
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Summary:A JEOL 2200FS transmission electron microscope equipped with a field emission gun, an objective lens spherical aberration corrector and an in-column energy filter has been used to acquire through focal series of high-resolution images of platinum nanocatalyst particles using a small value of the spherical aberration coefficient. The degree to which spherical aberration correction provides an improvement to image quality and interpretability for such particles is discussed, both with and without the use of through-focal series restoration.
ISSN:1742-6596
1742-6588
1742-6596
DOI:10.1088/1742-6596/26/1/006