Fizeau's interferometer device in thin superconducting films

We propose here that thin superconducting films, deposited on a substrate of high dielectric constant, be used in Fizeau's experiment, which probes how light propagates inside a drifting charged condensate. We predict that the phase shift of the propagating light is well described by an effecti...

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Bibliographic Details
Published in:Europhysics letters 2001-04, Vol.54 (1), p.98-104
Main Authors: Buisson, O, Hollauer, G, Doria, M. M
Format: Article
Language:English
Subjects:
74.10.+v
74.25.Gz
75.30.Mb
Condensed matter: electronic structure, electrical, magnetic, and optical properties
Exact sciences and technology
High-tc films
Physics
Superconducting films and low-dimensional structures
Superconductivity
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Summary:We propose here that thin superconducting films, deposited on a substrate of high dielectric constant, be used in Fizeau's experiment, which probes how light propagates inside a drifting charged condensate. We predict that the phase shift of the propagating light is well described by an effective London length, and is proportional to $v_0/(\omega/k)$, where v0 is the superfluid velocity and $\omega/k$ the phase velocity of the propagating mode. We claim that ${\rm YBa_2Cu_3O}_{6+x}$ thin films grown on $\rm SrTiO_3$ form a system where this phase shift is large enough to be measured.
ISSN:0295-5075
1286-4854
DOI:10.1209/epl/i2001-00234-2