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Frequency dependence of ultrahigh dielectric constant of novel synthesized SnO 2 nanoparticles thick films
In this work, the electric and dielectric properties of nanocrystalline SnO 2 thick films were studied using ac impedance spectroscopy under different conditions through capacitance–frequency measurements in frequency range from 1 Hz to 1 MHz and bias voltage range from 0 V to 2 V. Results showed th...
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Published in: | Current applied physics 2011, 11(3), , pp.409-413 |
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Main Authors: | , , , , |
Format: | Article |
Language: | English |
Subjects: | |
Online Access: | Get full text |
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Summary: | In this work, the electric and dielectric properties of nanocrystalline SnO
2 thick films were studied using ac impedance spectroscopy under different conditions through capacitance–frequency measurements in frequency range from 1
Hz to 1
MHz and bias voltage range from 0
V to 2
V. Results showed that dielectric constant (
ɛ′), dielectric loss (
ɛ″), loss tangent (tan
δ), ac electrical conductivity (
σ) and the electric modulus (
M) are strongly frequency dependent. A decrease in frequency accompanied with an increase in
ɛ′ and
ɛ″ values. Whereas, ac electrical conductivity (
σ), real (
M
/) and imaginary parts of electric modulus (
M
//) values are increased with frequency increasing. A comparative study showed that our prepared thick films have greater dielectric value than that of the reported data; hence can be used them as ultrahigh dielectric materials. |
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ISSN: | 1567-1739 1878-1675 |
DOI: | 10.1016/j.cap.2010.08.011 |