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Frequency dependence of ultrahigh dielectric constant of novel synthesized SnO 2 nanoparticles thick films

In this work, the electric and dielectric properties of nanocrystalline SnO 2 thick films were studied using ac impedance spectroscopy under different conditions through capacitance–frequency measurements in frequency range from 1 Hz to 1 MHz and bias voltage range from 0 V to 2 V. Results showed th...

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Bibliographic Details
Published in:Current applied physics 2011, 11(3), , pp.409-413
Main Authors: Mahmoudi Chenari, H., Hassanzadeh, Ali, Golzan, M.M., Sedghi, H., Talebian, M.
Format: Article
Language:English
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Summary:In this work, the electric and dielectric properties of nanocrystalline SnO 2 thick films were studied using ac impedance spectroscopy under different conditions through capacitance–frequency measurements in frequency range from 1 Hz to 1 MHz and bias voltage range from 0 V to 2 V. Results showed that dielectric constant ( ɛ′), dielectric loss ( ɛ″), loss tangent (tan δ), ac electrical conductivity ( σ) and the electric modulus ( M) are strongly frequency dependent. A decrease in frequency accompanied with an increase in ɛ′ and ɛ″ values. Whereas, ac electrical conductivity ( σ), real ( M /) and imaginary parts of electric modulus ( M //) values are increased with frequency increasing. A comparative study showed that our prepared thick films have greater dielectric value than that of the reported data; hence can be used them as ultrahigh dielectric materials.
ISSN:1567-1739
1878-1675
DOI:10.1016/j.cap.2010.08.011