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Effect of series resistance and interface states on the I– V, C– V and G/ ω– V characteristics in Au/Bi-doped polyvinyl alcohol (PVA)/n-Si Schottky barrier diodes at room temperature
The forward and reverse bias current–voltage ( I– V), capacitance–voltage ( C– V) and conductance–voltage ( G/ ω– V) characteristics of the Au/PVA (Bi-doped)/n-Si Schottky barrier diodes (SBDs) have been investigated at room temperature by taking the interface states ( N ss) and series resistance (...
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Published in: | Current applied physics 2012, 12(1), , pp.266-272 |
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Main Authors: | , , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | The forward and reverse bias current–voltage (
I–
V), capacitance–voltage (
C–
V) and conductance–voltage (
G/
ω–
V) characteristics of the Au/PVA (Bi-doped)/n-Si Schottky barrier diodes (SBDs) have been investigated at room temperature by taking the interface states (
N
ss) and series resistance (
R
s) effects into account. The voltage dependent profiles of resistance (
R
i
) were obtained from both the
I–
V and
C/
G–
V measurements by using Ohm’s Law and Nicollian methods. The obtained values of
R
i
with agreement each other especially at sufficiently high bias voltages which correspond the value of
R
s of the diode. Therefore, the energy density distribution profile of
N
ss was obtained from the forward bias
I–
V data taking the bias dependence of the effective barrier height (BH)
Φ
e and
R
s into account. The high value of ideality factor (
n) was attributed to high density of
N
ss and interfacial polymer layer at metal/semiconductor (
M/
S) interface. In order to examine the frequency dependence of some of the electrical parameters such as doping donor concentration (
N
D),
Φ
e,
R
s and
N
ss values,
C–
V and
G/
ω–
V measurements of the diode were performed at room temperature in the frequency range of 50
kHz–5
MHz. Experimental results confirmed that the
N
ss,
R
s and interfacial layer are important parameters that influence electrical characteristics of SBD.
►
I–V, C–V and
G/ω–V characteristics of the Au/PVA (Bi-doped)/n-Si SBDs were investigated. ► Frequency dependent interface states (Nss) and series resistance (Rs) profiles were determined. ► Admittance measurements were performed at room temperature in the frequency range of 50 kHz–5 MHz. ► Experimental results confirmed that the Nss and Rs are influence electrical characteristics of SBDs. |
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ISSN: | 1567-1739 1878-1675 |
DOI: | 10.1016/j.cap.2011.06.016 |