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Characteristics of ZnO MSM UV photodetector with Ni contact electrodes on poly propylene carbonate (PPC) plastic substrate
In this study, we report the fabrication of ZnO metal-semiconductor-metal UV photodetector (MSM UV PD) by deposition ZnO thin film on poly propylene carbonate (PPC) plastic substrate using direct current (DC) sputtering technique, and Nickel (Ni) contact as electrodes. The structural, optical and el...
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Published in: | Current applied physics 2010, 10(6), , pp.1452-1455 |
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creator | Jandow, N.N. Yam, F.K. Thahab, S.M. Abu Hassan, H. Ibrahim, K. |
description | In this study, we report the fabrication of ZnO metal-semiconductor-metal UV photodetector (MSM UV PD) by deposition ZnO thin film on poly propylene carbonate (PPC) plastic substrate using direct current (DC) sputtering technique, and Nickel (Ni) contact as electrodes. The structural, optical and electrical properties of the ZnO thin film were investigated by using atomic force microscopy (AFM), X-Ray diffraction (XRD) measurement, and photoluminescence (PL). The electrical characteristics of the detector were investigated using the current–voltage (
I–
V) measurements, the dark- and photo-currents were found to be 1.04 and 93.80
μA, respectively. Using forward dark conditions at 5
volt; the barrier height
Φ
B
was calculated to be 0.675
eV. Under incident wavelength of 385
nm, it was found that the maximum responsivity (
R) of the Ni/ZnO/Ni MSM PD was found to be 1.59
A/W. |
doi_str_mv | 10.1016/j.cap.2010.05.012 |
format | article |
fullrecord | <record><control><sourceid>proquest_nrf_k</sourceid><recordid>TN_cdi_nrf_kci_oai_kci_go_kr_ARTI_103971</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><els_id>S1567173910001549</els_id><sourcerecordid>787279959</sourcerecordid><originalsourceid>FETCH-LOGICAL-c362t-82d17b65b99670b9f21435bc11bf2e15a8b9c82c31ecff27d131a4e3508aec0e3</originalsourceid><addsrcrecordid>eNp9kU1P3DAQhqOqSKWUH8DNt8IhW4-zjmNxQivaIkFBfB24WI4z6XoJcbC9rba_vrPdnjmNPfM-M5p5i-II-Aw41F9WM2enmeD053LGQbwr9qFRTQm1ku_pLWtVgqr0h-JjSitOzJzP94s_i6WN1mWMPmXvEgs9exqv2dXdFXt4ZNMy5NBhRpdDZL99XrIfnrkwZmIYDpSPVCdsZFMYNmyKYdoMOCJzNrZhtBnZ8c3N4oRNg91OYGndphwp_6nY6-2Q8PB_PCgevp7fL76Xl9ffLhZnl6WrapHLRnSg2lq2WteKt7oXMK9k6wDaXiBI27TaNcJVgK7vheqgAjvHSvLGouNYHRTHu75j7M2z8yZY_y_-DOY5mrPb-wsDvNIKSPp5J6U1XteYsnnxyeEw2BHDOhnVKKG0lpqUsFO6GFKK2Jsp-hcbN9TKbB0xK0OOmK0jhktDjhBzumOQtv3lMZrkPI4OOx_pkKYL_g36L4thlGQ</addsrcrecordid><sourcetype>Open Website</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>787279959</pqid></control><display><type>article</type><title>Characteristics of ZnO MSM UV photodetector with Ni contact electrodes on poly propylene carbonate (PPC) plastic substrate</title><source>Elsevier</source><creator>Jandow, N.N. ; Yam, F.K. ; Thahab, S.M. ; Abu Hassan, H. ; Ibrahim, K.</creator><creatorcontrib>Jandow, N.N. ; Yam, F.K. ; Thahab, S.M. ; Abu Hassan, H. ; Ibrahim, K.</creatorcontrib><description>In this study, we report the fabrication of ZnO metal-semiconductor-metal UV photodetector (MSM UV PD) by deposition ZnO thin film on poly propylene carbonate (PPC) plastic substrate using direct current (DC) sputtering technique, and Nickel (Ni) contact as electrodes. The structural, optical and electrical properties of the ZnO thin film were investigated by using atomic force microscopy (AFM), X-Ray diffraction (XRD) measurement, and photoluminescence (PL). The electrical characteristics of the detector were investigated using the current–voltage (
I–
V) measurements, the dark- and photo-currents were found to be 1.04 and 93.80
μA, respectively. Using forward dark conditions at 5
volt; the barrier height
Φ
B
was calculated to be 0.675
eV. Under incident wavelength of 385
nm, it was found that the maximum responsivity (
R) of the Ni/ZnO/Ni MSM PD was found to be 1.59
A/W.</description><identifier>ISSN: 1567-1739</identifier><identifier>EISSN: 1878-1675</identifier><identifier>DOI: 10.1016/j.cap.2010.05.012</identifier><language>eng</language><publisher>Elsevier B.V</publisher><subject>Barrier height ; Carbonates ; Contact ; DC sputtering ; Direct current ; Electrodes ; Metal–semiconductor–metal (MSM) photodiodes ; Nickel ; Photodetectors ; Propylene ; Thin films ; Zinc oxide ; ZnO ; 물리학</subject><ispartof>Current Applied Physics, 2010, 10(6), , pp.1452-1455</ispartof><rights>2010 Elsevier B.V.</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c362t-82d17b65b99670b9f21435bc11bf2e15a8b9c82c31ecff27d131a4e3508aec0e3</citedby><cites>FETCH-LOGICAL-c362t-82d17b65b99670b9f21435bc11bf2e15a8b9c82c31ecff27d131a4e3508aec0e3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,27924,27925</link.rule.ids><backlink>$$Uhttps://www.kci.go.kr/kciportal/ci/sereArticleSearch/ciSereArtiView.kci?sereArticleSearchBean.artiId=ART001496166$$DAccess content in National Research Foundation of Korea (NRF)$$Hfree_for_read</backlink></links><search><creatorcontrib>Jandow, N.N.</creatorcontrib><creatorcontrib>Yam, F.K.</creatorcontrib><creatorcontrib>Thahab, S.M.</creatorcontrib><creatorcontrib>Abu Hassan, H.</creatorcontrib><creatorcontrib>Ibrahim, K.</creatorcontrib><title>Characteristics of ZnO MSM UV photodetector with Ni contact electrodes on poly propylene carbonate (PPC) plastic substrate</title><title>Current applied physics</title><description>In this study, we report the fabrication of ZnO metal-semiconductor-metal UV photodetector (MSM UV PD) by deposition ZnO thin film on poly propylene carbonate (PPC) plastic substrate using direct current (DC) sputtering technique, and Nickel (Ni) contact as electrodes. The structural, optical and electrical properties of the ZnO thin film were investigated by using atomic force microscopy (AFM), X-Ray diffraction (XRD) measurement, and photoluminescence (PL). The electrical characteristics of the detector were investigated using the current–voltage (
I–
V) measurements, the dark- and photo-currents were found to be 1.04 and 93.80
μA, respectively. Using forward dark conditions at 5
volt; the barrier height
Φ
B
was calculated to be 0.675
eV. Under incident wavelength of 385
nm, it was found that the maximum responsivity (
R) of the Ni/ZnO/Ni MSM PD was found to be 1.59
A/W.</description><subject>Barrier height</subject><subject>Carbonates</subject><subject>Contact</subject><subject>DC sputtering</subject><subject>Direct current</subject><subject>Electrodes</subject><subject>Metal–semiconductor–metal (MSM) photodiodes</subject><subject>Nickel</subject><subject>Photodetectors</subject><subject>Propylene</subject><subject>Thin films</subject><subject>Zinc oxide</subject><subject>ZnO</subject><subject>물리학</subject><issn>1567-1739</issn><issn>1878-1675</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2010</creationdate><recordtype>article</recordtype><recordid>eNp9kU1P3DAQhqOqSKWUH8DNt8IhW4-zjmNxQivaIkFBfB24WI4z6XoJcbC9rba_vrPdnjmNPfM-M5p5i-II-Aw41F9WM2enmeD053LGQbwr9qFRTQm1ku_pLWtVgqr0h-JjSitOzJzP94s_i6WN1mWMPmXvEgs9exqv2dXdFXt4ZNMy5NBhRpdDZL99XrIfnrkwZmIYDpSPVCdsZFMYNmyKYdoMOCJzNrZhtBnZ8c3N4oRNg91OYGndphwp_6nY6-2Q8PB_PCgevp7fL76Xl9ffLhZnl6WrapHLRnSg2lq2WteKt7oXMK9k6wDaXiBI27TaNcJVgK7vheqgAjvHSvLGouNYHRTHu75j7M2z8yZY_y_-DOY5mrPb-wsDvNIKSPp5J6U1XteYsnnxyeEw2BHDOhnVKKG0lpqUsFO6GFKK2Jsp-hcbN9TKbB0xK0OOmK0jhktDjhBzumOQtv3lMZrkPI4OOx_pkKYL_g36L4thlGQ</recordid><startdate>20101101</startdate><enddate>20101101</enddate><creator>Jandow, N.N.</creator><creator>Yam, F.K.</creator><creator>Thahab, S.M.</creator><creator>Abu Hassan, H.</creator><creator>Ibrahim, K.</creator><general>Elsevier B.V</general><general>한국물리학회</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7QQ</scope><scope>7U5</scope><scope>8FD</scope><scope>JG9</scope><scope>L7M</scope><scope>ACYCR</scope></search><sort><creationdate>20101101</creationdate><title>Characteristics of ZnO MSM UV photodetector with Ni contact electrodes on poly propylene carbonate (PPC) plastic substrate</title><author>Jandow, N.N. ; Yam, F.K. ; Thahab, S.M. ; Abu Hassan, H. ; Ibrahim, K.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c362t-82d17b65b99670b9f21435bc11bf2e15a8b9c82c31ecff27d131a4e3508aec0e3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2010</creationdate><topic>Barrier height</topic><topic>Carbonates</topic><topic>Contact</topic><topic>DC sputtering</topic><topic>Direct current</topic><topic>Electrodes</topic><topic>Metal–semiconductor–metal (MSM) photodiodes</topic><topic>Nickel</topic><topic>Photodetectors</topic><topic>Propylene</topic><topic>Thin films</topic><topic>Zinc oxide</topic><topic>ZnO</topic><topic>물리학</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Jandow, N.N.</creatorcontrib><creatorcontrib>Yam, F.K.</creatorcontrib><creatorcontrib>Thahab, S.M.</creatorcontrib><creatorcontrib>Abu Hassan, H.</creatorcontrib><creatorcontrib>Ibrahim, K.</creatorcontrib><collection>CrossRef</collection><collection>Ceramic Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Korean Citation Index</collection><jtitle>Current applied physics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Jandow, N.N.</au><au>Yam, F.K.</au><au>Thahab, S.M.</au><au>Abu Hassan, H.</au><au>Ibrahim, K.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Characteristics of ZnO MSM UV photodetector with Ni contact electrodes on poly propylene carbonate (PPC) plastic substrate</atitle><jtitle>Current applied physics</jtitle><date>2010-11-01</date><risdate>2010</risdate><volume>10</volume><issue>6</issue><spage>1452</spage><epage>1455</epage><pages>1452-1455</pages><issn>1567-1739</issn><eissn>1878-1675</eissn><abstract>In this study, we report the fabrication of ZnO metal-semiconductor-metal UV photodetector (MSM UV PD) by deposition ZnO thin film on poly propylene carbonate (PPC) plastic substrate using direct current (DC) sputtering technique, and Nickel (Ni) contact as electrodes. The structural, optical and electrical properties of the ZnO thin film were investigated by using atomic force microscopy (AFM), X-Ray diffraction (XRD) measurement, and photoluminescence (PL). The electrical characteristics of the detector were investigated using the current–voltage (
I–
V) measurements, the dark- and photo-currents were found to be 1.04 and 93.80
μA, respectively. Using forward dark conditions at 5
volt; the barrier height
Φ
B
was calculated to be 0.675
eV. Under incident wavelength of 385
nm, it was found that the maximum responsivity (
R) of the Ni/ZnO/Ni MSM PD was found to be 1.59
A/W.</abstract><pub>Elsevier B.V</pub><doi>10.1016/j.cap.2010.05.012</doi><tpages>4</tpages></addata></record> |
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subjects | Barrier height Carbonates Contact DC sputtering Direct current Electrodes Metal–semiconductor–metal (MSM) photodiodes Nickel Photodetectors Propylene Thin films Zinc oxide ZnO 물리학 |
title | Characteristics of ZnO MSM UV photodetector with Ni contact electrodes on poly propylene carbonate (PPC) plastic substrate |
url | http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-26T00%3A36%3A06IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_nrf_k&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Characteristics%20of%20ZnO%20MSM%20UV%20photodetector%20with%20Ni%20contact%20electrodes%20on%20poly%20propylene%20carbonate%20(PPC)%20plastic%20substrate&rft.jtitle=Current%20applied%20physics&rft.au=Jandow,%20N.N.&rft.date=2010-11-01&rft.volume=10&rft.issue=6&rft.spage=1452&rft.epage=1455&rft.pages=1452-1455&rft.issn=1567-1739&rft.eissn=1878-1675&rft_id=info:doi/10.1016/j.cap.2010.05.012&rft_dat=%3Cproquest_nrf_k%3E787279959%3C/proquest_nrf_k%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c362t-82d17b65b99670b9f21435bc11bf2e15a8b9c82c31ecff27d131a4e3508aec0e3%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_pqid=787279959&rft_id=info:pmid/&rfr_iscdi=true |