Fabrication and characterization of Au/SiO2 nanocomposite films grown by radio-frequency cosputtering

Au/SiO2 nanocomposite films were prepared on Si wafers by cosputtering of SiO2 and gold wires. Au/Si atomic ratios in Au/SiO2 nanocomposite films were varied from 0.53 to 0.92 by controlling the length of gold wire to study the evolution of the crystallization of gold, the size of Au/SiO2 nanocompos...

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Bibliographic Details
Published in:Current applied physics 2008, 8(6), , pp.761-765
Main Authors: Jung, Kyung-Han, Yoon, Jong-Won, Koshizaki, Naoto, Kwon, Young-Soo
Format: Article
Language:English
Subjects:
Atomic ratio
Au/SiO2
Cosputtering
Nanocomposite film
물리학
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Summary:Au/SiO2 nanocomposite films were prepared on Si wafers by cosputtering of SiO2 and gold wires. Au/Si atomic ratios in Au/SiO2 nanocomposite films were varied from 0.53 to 0.92 by controlling the length of gold wire to study the evolution of the crystallization of gold, the size of Au/SiO2 nanocomposite particles, and the optical properties of as-deposited Au/SiO2 nanocomposite films. An X-ray photoelectron spectroscopy reveals that Au exists as a metallic phase in the bulk of SiO2 matrix. Dome-shaped Au/SiO2 nanocomposite particles and both Au (111) and (200) planes were observed in a field-emission scanning electron microscopy and X-ray diffraction studies respectively. With an ultraviolet-visible, absorption peaks of Au/SiO2 nanocomposite films were observed at 525nm.
ISSN:1567-1739
1878-1675
DOI:10.1016/j.cap.2007.04.054