Loading…

Rapid curing of solution-processed zinc oxide films by pulse-light annealing for thin-film transistor applications

In this study, a pulse-light annealing method is proposed for the rapid fabrication of solution-processed zinc oxide (ZnO) thinfilm transistors (TFTs). Transistors that were fabricated by the pulse-light annealing method, with the annealing being carried out at 90℃ for 15 s, exhibited a mobility of...

Full description

Saved in:
Bibliographic Details
Published in:Electronic materials letters 2015, 11(1), , pp.82-87
Main Authors: Kim, Dong Wook, Park, Jaehoon, Hwang, Jaeeun, Kim, Hong Doo, Ryu, Jin Hwa, Lee, Kang Bok, Baek, Kyu Ha, Do, Lee-Mi, Choi, Jong Sun
Format: Article
Language:English
Subjects:
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:In this study, a pulse-light annealing method is proposed for the rapid fabrication of solution-processed zinc oxide (ZnO) thinfilm transistors (TFTs). Transistors that were fabricated by the pulse-light annealing method, with the annealing being carried out at 90℃ for 15 s, exhibited a mobility of 0.05 cm 2 /Vs and an on/off current ratio of 10 6 . Such electrical properties are quite close to those of devices that are thermally annealed at 165℃ for 40 min. X-ray photoelectron spectroscopy analysis of ZnO films showed that the activation energy required to form a Zn-O bond is entirely supplied within 15 s of pulse-light exposure. We conclude that the pulse-light annealing method is viable for rapidly curing solution-processable oxide semiconductors for TFT applications.
ISSN:1738-8090
2093-6788
DOI:10.1007/s13391-014-4209-0