Effect of different types of interface roughness on electron conductance

This study is a theoretical investigation on transport properties of heterostructures-consisting of double rough barriers. The interfaces of barriers are presented with two different types of rough interfaces. These interfaces are produced by the pure random deposition and ballistic deposition on tw...

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Bibliographic Details
Published in:Electronic materials letters 2014, 10(3), , pp.573-578
Main Authors: Ebrahiminejad, Zhaleh, Dariani, Reza Sabet, Masoudi, Seyed Farhad
Format: Article
Language:English
Subjects:
Barriers
Characterization and Evaluation of Materials
Chemistry and Materials Science
Condensed Matter Physics
Conductance
Deposition
Electronic materials
Interface roughness
Materials Science
Nanotechnology
Nanotechnology and Microengineering
Optical and Electronic Materials
Transport
Transport properties
Two dimensional
전자/정보통신공학
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Summary:This study is a theoretical investigation on transport properties of heterostructures-consisting of double rough barriers. The interfaces of barriers are presented with two different types of rough interfaces. These interfaces are produced by the pure random deposition and ballistic deposition on two-dimensional substrates. The resonant transport for two types of interfaces are studied and compared with each other. In addition, the I – V characteristic for different interface-roughness types and for different temperatures is investigated. The results illustrate that both the transmission probability and the current density depend on deposition model and interface morphology.
ISSN:1738-8090
2093-6788
DOI:10.1007/s13391-013-3119-x