High-efficiency BIRA for embedded memories with a high repair rate and low area overhead

High-efficiency built-in redundancy analysis (BIRA) is presented. The proposed BIRA uses three techniques to achieve a high repair rate using spare mapping registers with adjustable fault tags to reduce area overhead. Simulation results show that the proposed BIRA is a reasonable solution for embedd...

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Bibliographic Details
Published in:Journal of semiconductor technology and science 2012, 12(3), 47, pp.266-269
Main Authors: Lee, Joo-Hwan, Park, Ki-Hyun, Kang, Sung-Ho
Format: Article
Language:English
Subjects:
전기공학
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Summary:High-efficiency built-in redundancy analysis (BIRA) is presented. The proposed BIRA uses three techniques to achieve a high repair rate using spare mapping registers with adjustable fault tags to reduce area overhead. Simulation results show that the proposed BIRA is a reasonable solution for embedded memories. KCI Citation Count: 2
ISSN:1598-1657
2233-4866
DOI:10.5573/JSTS.2012.12.3.266