Simple Near-Field Optical Recording Using Bent Cantilever Probes

This paper describes our high-density near-field optical recording using bent cantilever fiber probes installed in an atomic force microscope. We conducted a near-field reading of nano-scale hole patterns with a 100 nm spatial resolution and a 25 ${\mu}m$/s scan speed; this implies a capability of a...

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Bibliographic Details
Published in:ETRI journal 2002, 24(3), , pp.205-210
Main Authors: Kim, Jeong-Yong, Song, Ki-Bong, Park, Kang-Ho, Lee, Hyo-Won, Kim, Eun-Kyoung
Format: Article
Language:Korean
Subjects:
전자/정보통신공학
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Summary:This paper describes our high-density near-field optical recording using bent cantilever fiber probes installed in an atomic force microscope. We conducted a near-field reading of nano-scale hole patterns with a 100 nm spatial resolution and a 25 ${\mu}m$/s scan speed; this implies a capability of a data reading density of 60 Gb/$in^2$ with a 0.25 kbps data transfer rate. In addition, we investigated re-writable near-field recording on photochromic diarylethene films. We successfully recorded erasable memory bits having a minimum width of 600 nm in a writing time as short as 30ms. We found that using a cantilever probe simplifies the setup and operation of the near-field optical recording system and may offer multifunctional recording capabilities.
ISSN:1225-6463
2233-7326