A New Approach for Built-in Self-Test of 4.5 to 5.5 GHz Low-Noise Amplifiers

This paper presents a low-cost RF parameter estimation technique using a new RF built-in self-test (BIST) circuit and efficient DC measurement for 4.5 to 5.5 GHz low noise amplifiers (LNAs). The BIST circuit measures gain, noise figure, input impedance, and input return loss for an LNA. The BIST cir...

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Bibliographic Details
Published in:ETRI journal 2006, 28(3), , pp.355-363
Main Authors: Ryu, Jee-Youl, Noh, Seok-Ho
Format: Article
Language:Korean
Subjects:
전자/정보통신공학
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Summary:This paper presents a low-cost RF parameter estimation technique using a new RF built-in self-test (BIST) circuit and efficient DC measurement for 4.5 to 5.5 GHz low noise amplifiers (LNAs). The BIST circuit measures gain, noise figure, input impedance, and input return loss for an LNA. The BIST circuit is designed using $0.18\;{\mu}m$ SiGe technology. The test technique utilizes input impedance matching and output DC voltage measurements. The technique is simple and inexpensive.
ISSN:1225-6463
2233-7326