Nondestructive three-dimensional characterization of grain boundaries by X-ray crystal microscopy

The results from an emerging method of nondestructive grain boundary characterization, with unprecedented sensitivity to neighbor-grain misorientation and grain boundary morphology are reported. The method utilizes differential aperture X-ray microscopy to determine the local crystallographic orient...

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Published in:Ultramicroscopy 2005-06, Vol.103 (3), p.199-204
Main Authors: Liu, Wenjun, Ice, Gene E., Larson, Bennett C., Yang, Wenge, Tischler, Jonathan Z.
Format: Article
Language:English
Subjects:
3d X-ray crystal microscopy
Coincident site lattice
GRAIN BOUNDARIES
Grain boundary characterization
MATERIALS SCIENCE
MICROSCOPY
MORPHOLOGY
NICKEL
ORIENTATION
SENSITIVITY
SPATIAL RESOLUTION
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cited_by cdi_FETCH-LOGICAL-c424t-b74d418d3d2b0dd8927a14858bb38fe9a31c85c09d46fca1edefdbfdb59ad9073
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container_title Ultramicroscopy
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creator Liu, Wenjun
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description The results from an emerging method of nondestructive grain boundary characterization, with unprecedented sensitivity to neighbor-grain misorientation and grain boundary morphology are reported. The method utilizes differential aperture X-ray microscopy to determine the local crystallographic orientation of submicron volumes within polycrystalline materials. Initial measurements are described for a recrystallized Ni sample where the grain boundary type was identified at 85 grain boundaries within the framework of an ideal coincident site lattice (CSL) model. The remarkable resolution of this method is demonstrated by the
doi_str_mv 10.1016/j.ultramic.2004.11.022
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subjects 3d X-ray crystal microscopy
Coincident site lattice
GRAIN BOUNDARIES
Grain boundary characterization
MATERIALS SCIENCE
MICROSCOPY
MORPHOLOGY
NICKEL
ORIENTATION
SENSITIVITY
SPATIAL RESOLUTION
title Nondestructive three-dimensional characterization of grain boundaries by X-ray crystal microscopy
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