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Short focal length Kirkpatrick-Baez mirrors for a hard x-ray nanoprobe
We describe progress in the fabrication of short-focal-length total-external-reflection Kirkpatrick-Baez x-ray mirrors with ultralow figure errors. The short focal length optics produce nanoscale beams ( < 100 nm ) on conventional ( ∼ 64 m long) beamlines at third generation synchrotron sources....
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| Published in: | Review of scientific instruments 2005-11, Vol.76 (11), p.113701-113701-6 |
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| Main Authors: | , , , , , , |
| Format: | Article |
| Language: | English |
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| cited_by | cdi_FETCH-LOGICAL-c377t-7e5dfe5cb100e5954bc0cd05bd97f8969909d82f18c5b8007c73acc089add5b53 |
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| cites | cdi_FETCH-LOGICAL-c377t-7e5dfe5cb100e5954bc0cd05bd97f8969909d82f18c5b8007c73acc089add5b53 |
| container_end_page | 113701-6 |
| container_issue | 11 |
| container_start_page | 113701 |
| container_title | Review of scientific instruments |
| container_volume | 76 |
| creator | Liu, Wenjun Ice, Gene E. Tischler, Jonathan Z. Khounsary, Ali Liu, Chian Assoufid, Lahsen Macrander, Albert T. |
| description | We describe progress in the fabrication of short-focal-length total-external-reflection Kirkpatrick-Baez x-ray mirrors with ultralow figure errors. The short focal length optics produce nanoscale beams
(
<
100
nm
)
on conventional (
∼
64
m
long) beamlines at third generation synchrotron sources. The total-external reflection optics are inherently achromatic and efficiently focus a white (polychromatic) or a tunable monochromatic spectrum of x rays. The ability to focus independent of wavelength allows novel new experimental capabilities. Mirrors have been fabricated both by computer assisted profiling (differential polishing) and by profile coating (coating through a mask onto ultra-smooth surfaces). A doubly focused
85
×
95
nm
2
hard x-ray nanobeam has been obtained on the UNICAT beamline 34-ID at the Advanced Photon Source. The performance of the mirrors, techniques for characterizing the spot size, and factors limiting focusing performance are discussed. |
| doi_str_mv | 10.1063/1.2125730 |
| format | article |
| fullrecord | <record><control><sourceid>scitation_osti_</sourceid><recordid>TN_cdi_osti_scitechconnect_1003374</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>rsi</sourcerecordid><originalsourceid>FETCH-LOGICAL-c377t-7e5dfe5cb100e5954bc0cd05bd97f8969909d82f18c5b8007c73acc089add5b53</originalsourceid><addsrcrecordid>eNp10EFPwyAYxnFiNHFOD34D4s1DJ5RSysVEF6dmSzyoZ0JfqK3bSgMcnJ9etu4qFy6_PMn7R-iakhklJbujs5zmXDBygiaUVDITZc5O0YQQVmSlKKpzdBHCN0mPUzpBi_fW-YgbB3qDN7b_ii1edn496Og7WGeP2v7ibee98yEpjzVutTf4J_N6h3vdu8G72l6is0Zvgr06_lP0uXj6mL9kq7fn1_nDKgMmRMyE5aaxHGpKiOWSFzUQMITXRoqmkqWURJoqb2gFvK4IESCYBkh3aGN4zdkU3Yy7LsROBeiihRZc31uIKo0yJoqEbkcE3oXgbaMG32213yWh9pUUVcdKyd6Pdr-lY-f6__EhlTqkUmMqtWR_YQxuVg</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Short focal length Kirkpatrick-Baez mirrors for a hard x-ray nanoprobe</title><source>American Institute of Physics:Jisc Collections:Transitional Journals Agreement 2021-23 (Reading list)</source><source>American Institute of Physics</source><creator>Liu, Wenjun ; Ice, Gene E. ; Tischler, Jonathan Z. ; Khounsary, Ali ; Liu, Chian ; Assoufid, Lahsen ; Macrander, Albert T.</creator><creatorcontrib>Liu, Wenjun ; Ice, Gene E. ; Tischler, Jonathan Z. ; Khounsary, Ali ; Liu, Chian ; Assoufid, Lahsen ; Macrander, Albert T. ; Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)</creatorcontrib><description>We describe progress in the fabrication of short-focal-length total-external-reflection Kirkpatrick-Baez x-ray mirrors with ultralow figure errors. The short focal length optics produce nanoscale beams
(
<
100
nm
)
on conventional (
∼
64
m
long) beamlines at third generation synchrotron sources. The total-external reflection optics are inherently achromatic and efficiently focus a white (polychromatic) or a tunable monochromatic spectrum of x rays. The ability to focus independent of wavelength allows novel new experimental capabilities. Mirrors have been fabricated both by computer assisted profiling (differential polishing) and by profile coating (coating through a mask onto ultra-smooth surfaces). A doubly focused
85
×
95
nm
2
hard x-ray nanobeam has been obtained on the UNICAT beamline 34-ID at the Advanced Photon Source. The performance of the mirrors, techniques for characterizing the spot size, and factors limiting focusing performance are discussed.</description><identifier>ISSN: 0034-6748</identifier><identifier>EISSN: 1089-7623</identifier><identifier>DOI: 10.1063/1.2125730</identifier><identifier>CODEN: RSINAK</identifier><language>eng</language><publisher>United States: American Institute of Physics</publisher><subject>ADVANCED PHOTON SOURCE ; COATINGS ; COMPUTERS ; FABRICATION ; FOCUSING ; MIRRORS ; OPTICS ; PARTICLE ACCELERATORS ; POLISHING ; REFLECTION ; SYNCHROTRONS ; WAVELENGTHS</subject><ispartof>Review of scientific instruments, 2005-11, Vol.76 (11), p.113701-113701-6</ispartof><rights>2005 American Institute of Physics</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c377t-7e5dfe5cb100e5954bc0cd05bd97f8969909d82f18c5b8007c73acc089add5b53</citedby><cites>FETCH-LOGICAL-c377t-7e5dfe5cb100e5954bc0cd05bd97f8969909d82f18c5b8007c73acc089add5b53</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://pubs.aip.org/rsi/article-lookup/doi/10.1063/1.2125730$$EHTML$$P50$$Gscitation$$H</linktohtml><link.rule.ids>230,314,780,782,784,795,885,27924,27925,76383</link.rule.ids><backlink>$$Uhttps://www.osti.gov/biblio/1003374$$D View this record in Osti.gov$$Hfree_for_read</backlink></links><search><creatorcontrib>Liu, Wenjun</creatorcontrib><creatorcontrib>Ice, Gene E.</creatorcontrib><creatorcontrib>Tischler, Jonathan Z.</creatorcontrib><creatorcontrib>Khounsary, Ali</creatorcontrib><creatorcontrib>Liu, Chian</creatorcontrib><creatorcontrib>Assoufid, Lahsen</creatorcontrib><creatorcontrib>Macrander, Albert T.</creatorcontrib><creatorcontrib>Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)</creatorcontrib><title>Short focal length Kirkpatrick-Baez mirrors for a hard x-ray nanoprobe</title><title>Review of scientific instruments</title><description>We describe progress in the fabrication of short-focal-length total-external-reflection Kirkpatrick-Baez x-ray mirrors with ultralow figure errors. The short focal length optics produce nanoscale beams
(
<
100
nm
)
on conventional (
∼
64
m
long) beamlines at third generation synchrotron sources. The total-external reflection optics are inherently achromatic and efficiently focus a white (polychromatic) or a tunable monochromatic spectrum of x rays. The ability to focus independent of wavelength allows novel new experimental capabilities. Mirrors have been fabricated both by computer assisted profiling (differential polishing) and by profile coating (coating through a mask onto ultra-smooth surfaces). A doubly focused
85
×
95
nm
2
hard x-ray nanobeam has been obtained on the UNICAT beamline 34-ID at the Advanced Photon Source. The performance of the mirrors, techniques for characterizing the spot size, and factors limiting focusing performance are discussed.</description><subject>ADVANCED PHOTON SOURCE</subject><subject>COATINGS</subject><subject>COMPUTERS</subject><subject>FABRICATION</subject><subject>FOCUSING</subject><subject>MIRRORS</subject><subject>OPTICS</subject><subject>PARTICLE ACCELERATORS</subject><subject>POLISHING</subject><subject>REFLECTION</subject><subject>SYNCHROTRONS</subject><subject>WAVELENGTHS</subject><issn>0034-6748</issn><issn>1089-7623</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2005</creationdate><recordtype>article</recordtype><recordid>eNp10EFPwyAYxnFiNHFOD34D4s1DJ5RSysVEF6dmSzyoZ0JfqK3bSgMcnJ9etu4qFy6_PMn7R-iakhklJbujs5zmXDBygiaUVDITZc5O0YQQVmSlKKpzdBHCN0mPUzpBi_fW-YgbB3qDN7b_ii1edn496Og7WGeP2v7ibee98yEpjzVutTf4J_N6h3vdu8G72l6is0Zvgr06_lP0uXj6mL9kq7fn1_nDKgMmRMyE5aaxHGpKiOWSFzUQMITXRoqmkqWURJoqb2gFvK4IESCYBkh3aGN4zdkU3Yy7LsROBeiihRZc31uIKo0yJoqEbkcE3oXgbaMG32213yWh9pUUVcdKyd6Pdr-lY-f6__EhlTqkUmMqtWR_YQxuVg</recordid><startdate>20051101</startdate><enddate>20051101</enddate><creator>Liu, Wenjun</creator><creator>Ice, Gene E.</creator><creator>Tischler, Jonathan Z.</creator><creator>Khounsary, Ali</creator><creator>Liu, Chian</creator><creator>Assoufid, Lahsen</creator><creator>Macrander, Albert T.</creator><general>American Institute of Physics</general><scope>AAYXX</scope><scope>CITATION</scope><scope>OTOTI</scope></search><sort><creationdate>20051101</creationdate><title>Short focal length Kirkpatrick-Baez mirrors for a hard x-ray nanoprobe</title><author>Liu, Wenjun ; Ice, Gene E. ; Tischler, Jonathan Z. ; Khounsary, Ali ; Liu, Chian ; Assoufid, Lahsen ; Macrander, Albert T.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c377t-7e5dfe5cb100e5954bc0cd05bd97f8969909d82f18c5b8007c73acc089add5b53</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2005</creationdate><topic>ADVANCED PHOTON SOURCE</topic><topic>COATINGS</topic><topic>COMPUTERS</topic><topic>FABRICATION</topic><topic>FOCUSING</topic><topic>MIRRORS</topic><topic>OPTICS</topic><topic>PARTICLE ACCELERATORS</topic><topic>POLISHING</topic><topic>REFLECTION</topic><topic>SYNCHROTRONS</topic><topic>WAVELENGTHS</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Liu, Wenjun</creatorcontrib><creatorcontrib>Ice, Gene E.</creatorcontrib><creatorcontrib>Tischler, Jonathan Z.</creatorcontrib><creatorcontrib>Khounsary, Ali</creatorcontrib><creatorcontrib>Liu, Chian</creatorcontrib><creatorcontrib>Assoufid, Lahsen</creatorcontrib><creatorcontrib>Macrander, Albert T.</creatorcontrib><creatorcontrib>Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)</creatorcontrib><collection>CrossRef</collection><collection>OSTI.GOV</collection><jtitle>Review of scientific instruments</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Liu, Wenjun</au><au>Ice, Gene E.</au><au>Tischler, Jonathan Z.</au><au>Khounsary, Ali</au><au>Liu, Chian</au><au>Assoufid, Lahsen</au><au>Macrander, Albert T.</au><aucorp>Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)</aucorp><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Short focal length Kirkpatrick-Baez mirrors for a hard x-ray nanoprobe</atitle><jtitle>Review of scientific instruments</jtitle><date>2005-11-01</date><risdate>2005</risdate><volume>76</volume><issue>11</issue><spage>113701</spage><epage>113701-6</epage><pages>113701-113701-6</pages><issn>0034-6748</issn><eissn>1089-7623</eissn><coden>RSINAK</coden><abstract>We describe progress in the fabrication of short-focal-length total-external-reflection Kirkpatrick-Baez x-ray mirrors with ultralow figure errors. The short focal length optics produce nanoscale beams
(
<
100
nm
)
on conventional (
∼
64
m
long) beamlines at third generation synchrotron sources. The total-external reflection optics are inherently achromatic and efficiently focus a white (polychromatic) or a tunable monochromatic spectrum of x rays. The ability to focus independent of wavelength allows novel new experimental capabilities. Mirrors have been fabricated both by computer assisted profiling (differential polishing) and by profile coating (coating through a mask onto ultra-smooth surfaces). A doubly focused
85
×
95
nm
2
hard x-ray nanobeam has been obtained on the UNICAT beamline 34-ID at the Advanced Photon Source. The performance of the mirrors, techniques for characterizing the spot size, and factors limiting focusing performance are discussed.</abstract><cop>United States</cop><pub>American Institute of Physics</pub><doi>10.1063/1.2125730</doi></addata></record> |
| fulltext | fulltext |
| identifier | ISSN: 0034-6748 |
| ispartof | Review of scientific instruments, 2005-11, Vol.76 (11), p.113701-113701-6 |
| issn | 0034-6748 1089-7623 |
| language | eng |
| recordid | cdi_osti_scitechconnect_1003374 |
| source | American Institute of Physics:Jisc Collections:Transitional Journals Agreement 2021-23 (Reading list); American Institute of Physics |
| subjects | ADVANCED PHOTON SOURCE COATINGS COMPUTERS FABRICATION FOCUSING MIRRORS OPTICS PARTICLE ACCELERATORS POLISHING REFLECTION SYNCHROTRONS WAVELENGTHS |
| title | Short focal length Kirkpatrick-Baez mirrors for a hard x-ray nanoprobe |
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