Formation of Nickel Silicide from Direct-Liquid-Injection Chemical-Vapor-Deposited Nickel Nitride Films

Smooth, continuous, and highly conformal nickel nitride (NiN{sub x}) films were deposited by direct liquid injection (DLI)-chemical vapor deposition (CVD) using a solution of bis(N,N{prime}-di-tert-butylacetamidinato)nickel(II) in tetrahydronaphthalene as the nickel (Ni) source and ammonia (NH{sub 3...

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Bibliographic Details
Published in:Journal of the Electrochemical Society 2010, Vol.157 (6), p.H679
Main Authors: Li, Zhefeng, Gordon, Roy G., Li, Huazhi, Shenai, Deo V., Lavoie, Christian
Format: Article
Language:English
Subjects:
AMMONIA
ANNEALING
DEPOSITION
FIELD EFFECT TRANSISTORS
INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY
MICROELECTRONICS
national synchrotron light source
NICKEL
NICKEL NITRIDES
NICKEL SILICIDES
OXIDES
SEMICONDUCTOR DEVICES
SILICON
SUBSTRATES
SYNCHROTRONS
TETRALIN
TRANSISTORS
X-RAY DIFFRACTION
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Summary:Smooth, continuous, and highly conformal nickel nitride (NiN{sub x}) films were deposited by direct liquid injection (DLI)-chemical vapor deposition (CVD) using a solution of bis(N,N{prime}-di-tert-butylacetamidinato)nickel(II) in tetrahydronaphthalene as the nickel (Ni) source and ammonia (NH{sub 3}) as the coreactant gas. The DLI-CVD NiNx films grown on HF-last (100) silicon and on highly doped polysilicon substrates served as the intermediate for subsequent conversion into nickel silicide (NiSi), which is a key material for source, drain, and gate contacts in microelectronic devices. Rapid thermal annealing in the forming gas of DLI-CVD NiNx films formed continuous NiSi films at temperatures above 400 C. The resistivity of the NiSi films was 15{mu}{Omega} cm, close to the value for bulk crystals. The NiSi films have remarkably smooth and sharp interfaces with underlying Si substrates, thereby producing contacts for transistors with a higher drive current and a lower junction leakage. Resistivity and synchrotron X-ray diffraction in real-time during annealing of NiNx films showed the formation of a NiSi film at about 440 C, which is morphologically stable up to about 650 C. These NiSi films could find applications in future nanoscale complementary metal oxide semiconductor devices or three-dimensional metal-oxide-semiconductor devices such as Fin-type field effect transistors for the 22 nm technology node and beyond.
ISSN:0013-4651
1945-7111
DOI:10.1149/1.3388721