Measurement of the refractive index dispersion of As2Se3 bulk glass and thin films prior to and after laser irradiation and annealing using prism coupling in the near- and mid-infrared spectral range

• Published in: Review of scientific instruments 2011-05, Vol.82 (5), p.053103-053103
• Main Authors: Carlie, N, Anheier, Jr, N C, Qiao, H A, Bernacki, B, Phillips, M C, Petit, L, Musgraves, J D, Richardson, K
• Format: Article
• Language: English
• Subjects: ANNEALING; CHALCOGENIDES; DEPOSITION; GENERAL STUDIES OF NUCLEAR REACTORS; GLASS; IRRADIATION; LASERS; prism coupler, optical metrology, chalcogenide glass; PRISMS; REFRACTIVE INDEX; TARGETS; THIN FILMS; WAVELENGTHS
• ISSN: 0034-6748; 1089-7623
• DOI: 10.1063/1.3587616

The prism coupling technique has been utilized to measure the refractive index in the near- and mid-IR spectral region of chalcogenide glasses in bulk and thin film form. A commercial system (Metricon model 2010) has been modified with additional laser sources, detectors, and a new GaP prism to allow the measurement of refractive index dispersion over the 1.5-10.6 μm range. The instrumental error was found to be ±0.001 refractive index units across the entire wavelength region examined. Measurements on thermally evaporated AMTIR2 thin films confirmed that (i) the film deposition process provides thin films with reduced index compared to that of the bulk glass used as a target, (ii) annealing of the films increases the refractive index of the film to the level of the bulk glass used as a target to create it, and (iii) it is possible to locally increase the refractive index of the chalcogenide glass using laser exposure at 632.8 nm.