One-dimensional hard x-ray field retrieval using a moveable structure

We present a technique that allows measuring the field of an x-ray line focus using far-field intensity measurements only. One-dimensional phase retrieval with transverse translation diversity is used to recover a hard x-ray beam focused by a compound kinoform lens. The reconstruction is found to be...

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Bibliographic Details
Published in:Optics express 2010-08, Vol.18 (17), p.18374-18382
Main Authors: Guizar-Sicairos, Manuel, Evans-Lutterodt, Kenneth, Isakovic, Abdel F, Stein, Aaron, Warren, John B, Sandy, Alec R, Narayanan, Suresh, Fienup, James R
Format: Article
Language:English
Subjects:
Algorithms
BEAM PROFILES
BNL
HARD X RADIATION
Image Processing, Computer-Assisted - instrumentation
Image Processing, Computer-Assisted - methods
Lasers
Microscopy, Electron, Transmission - instrumentation
Microscopy, Electron, Transmission - methods
NANOSCIENCE AND NANOTECHNOLOGY
Scattering, Radiation
Ultraviolet Rays
X-Rays
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Summary:We present a technique that allows measuring the field of an x-ray line focus using far-field intensity measurements only. One-dimensional phase retrieval with transverse translation diversity is used to recover a hard x-ray beam focused by a compound kinoform lens. The reconstruction is found to be in good agreement with independent knife-edge scan measurements taken at separated planes. The approach avoids the need for measuring the beam profile at focus and allows narrower beams to be measured than the traditional knife-edge scan.
ISSN:1094-4087
1094-4087
DOI:10.1364/OE.18.018374