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One-dimensional hard x-ray field retrieval using a moveable structure

We present a technique that allows measuring the field of an x-ray line focus using far-field intensity measurements only. One-dimensional phase retrieval with transverse translation diversity is used to recover a hard x-ray beam focused by a compound kinoform lens. The reconstruction is found to be...

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Published in:	Optics express 2010-08, Vol.18 (17), p.18374-18382
Main Authors:	Guizar-Sicairos, Manuel, Evans-Lutterodt, Kenneth, Isakovic, Abdel F, Stein, Aaron, Warren, John B, Sandy, Alec R, Narayanan, Suresh, Fienup, James R
Format:	Article
Language:	English
Subjects:	Algorithms BEAM PROFILES BNL HARD X RADIATION Image Processing, Computer-Assisted - instrumentation Image Processing, Computer-Assisted - methods Lasers Microscopy, Electron, Transmission - instrumentation Microscopy, Electron, Transmission - methods NANOSCIENCE AND NANOTECHNOLOGY Scattering, Radiation Ultraviolet Rays X-Rays
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cited_by	cdi_FETCH-LOGICAL-c355t-8eb2339664fd5f802678d4aa1936439723a08f257be8d9ff30ca88b77d909b243
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container_end_page	18382
container_issue	17
container_start_page	18374
container_title	Optics express
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creator	Guizar-Sicairos, Manuel Evans-Lutterodt, Kenneth Isakovic, Abdel F Stein, Aaron Warren, John B Sandy, Alec R Narayanan, Suresh Fienup, James R
description	We present a technique that allows measuring the field of an x-ray line focus using far-field intensity measurements only. One-dimensional phase retrieval with transverse translation diversity is used to recover a hard x-ray beam focused by a compound kinoform lens. The reconstruction is found to be in good agreement with independent knife-edge scan measurements taken at separated planes. The approach avoids the need for measuring the beam profile at focus and allows narrower beams to be measured than the traditional knife-edge scan.
doi_str_mv	10.1364/OE.18.018374
format	article
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subjects	Algorithms BEAM PROFILES BNL HARD X RADIATION Image Processing, Computer-Assisted - instrumentation Image Processing, Computer-Assisted - methods Lasers Microscopy, Electron, Transmission - instrumentation Microscopy, Electron, Transmission - methods NANOSCIENCE AND NANOTECHNOLOGY Scattering, Radiation Ultraviolet Rays X-Rays
title	One-dimensional hard x-ray field retrieval using a moveable structure
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