Application of Micro-XRF for Nuclear Materials Characterization and Problem Solving

Micro-X-ray fluorescence (MXRF) used for >> 20 years To date MXRF has been underutilized for nuclear materials (NM) spatially-resolved elemental characterization. Scanning electron microscopy (SEM) with EDX much more common for NM characterization at a micro scale. But MXRF fills gap for large...

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Bibliographic Details
Main Authors: Worley, Christopher G, Tandon, Lav, Martinez, Patrick T, Decker, Diana L, Schwartz, Daniel S
Format: Conference Proceeding
Language:English
Subjects:
DISTRIBUTION
FLUORESCENCE
INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY
MORPHOLOGY
PARTICLE SIZE
PLUTONIUM
RESIDUES
RESOLUTION
SCANNING ELECTRON MICROSCOPY
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Summary:Micro-X-ray fluorescence (MXRF) used for >> 20 years To date MXRF has been underutilized for nuclear materials (NM) spatially-resolved elemental characterization. Scanning electron microscopy (SEM) with EDX much more common for NM characterization at a micro scale. But MXRF fills gap for larger 10's microns to cm{sup 2} scales. Will present four interesting NM applications using MXRF. Demonstrated unique value of MXRF for various plutonium applications. Although SEM has much higher resolution, MXRF clearly better for these larger scale samples (especially non-conducting samples). MXRF useful to quickly identify insoluble particles in Pu/Np oxide. MXRF vital to locating HEPA filter Pu particles over cm{sup 2} areas which were then extracted for SEM morphology and particle size distribution analysis. MXRF perfect for surface swipes which are far too large for practical SEM imaging, and loose residue would contaminate SEM vacuum chamber. MXRF imaging of ER Plutonium metal warrants further studies to explore metal elemental heterogeneity.
ISSN:0885-7156
1945-7413